Manipulations with diamond nanoparticles in SPM: the effect of electric field of the conductive probe tip

V. D. Frolov; V. A. Shershulin; E. V. Zavedeeev; P. A. Pivovarov; M. S. Komlenok; Robert Nemanich; V. I. Konov; I. I. Vlasov

doi:10.3103/S1068335616120046

Manipulations with diamond nanoparticles in SPM: the effect of electric field of the conductive probe tip

V. D. Frolov, V. A. Shershulin, E. V. Zavedeeev, P. A. Pivovarov, M. S. Komlenok, Robert Nemanich, V. I. Konov, I. I. Vlasov

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The role of the electric field during manipulations with diamond nanoparticles on a silicon substrate by a scanning probe microscope (SPM) tip is studied. It is found that the attractive force appearing in the contact between nanodiamond and an electrically charged tip is sufficient to detach and displace a chosen nanoparticle from initial to goal position under moderate mechanical stresses of the probe to nanoparticle. The problem of the control of the tip motion trajectory during manipulations is solved by visualizing the tip trace of the sample surface. The results obtained will be used for precision positioning of single-photon emitters based on luminescent nanodiamonds in microcavities.

Original language	English (US)
Pages (from-to)	356-360
Number of pages	5
Journal	Bulletin of the Lebedev Physics Institute
Volume	43
Issue number	12
DOIs	https://doi.org/10.3103/S1068335616120046
State	Published - Dec 1 2016

Keywords

SPM tip
electric field
manipulations
nanodiamond

ASJC Scopus subject areas

General Physics and Astronomy

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10.3103/S1068335616120046

Cite this

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title = "Manipulations with diamond nanoparticles in SPM: the effect of electric field of the conductive probe tip",

abstract = "The role of the electric field during manipulations with diamond nanoparticles on a silicon substrate by a scanning probe microscope (SPM) tip is studied. It is found that the attractive force appearing in the contact between nanodiamond and an electrically charged tip is sufficient to detach and displace a chosen nanoparticle from initial to goal position under moderate mechanical stresses of the probe to nanoparticle. The problem of the control of the tip motion trajectory during manipulations is solved by visualizing the tip trace of the sample surface. The results obtained will be used for precision positioning of single-photon emitters based on luminescent nanodiamonds in microcavities.",

keywords = "SPM tip, electric field, manipulations, nanodiamond",

author = "Frolov, {V. D.} and Shershulin, {V. A.} and Zavedeeev, {E. V.} and Pivovarov, {P. A.} and Komlenok, {M. S.} and Robert Nemanich and Konov, {V. I.} and Vlasov, {I. I.}",

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doi = "10.3103/S1068335616120046",

language = "English (US)",

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T1 - Manipulations with diamond nanoparticles in SPM

T2 - the effect of electric field of the conductive probe tip

AU - Frolov, V. D.

AU - Shershulin, V. A.

AU - Zavedeeev, E. V.

AU - Pivovarov, P. A.

AU - Komlenok, M. S.

AU - Nemanich, Robert

AU - Konov, V. I.

AU - Vlasov, I. I.

PY - 2016/12/1

Y1 - 2016/12/1

N2 - The role of the electric field during manipulations with diamond nanoparticles on a silicon substrate by a scanning probe microscope (SPM) tip is studied. It is found that the attractive force appearing in the contact between nanodiamond and an electrically charged tip is sufficient to detach and displace a chosen nanoparticle from initial to goal position under moderate mechanical stresses of the probe to nanoparticle. The problem of the control of the tip motion trajectory during manipulations is solved by visualizing the tip trace of the sample surface. The results obtained will be used for precision positioning of single-photon emitters based on luminescent nanodiamonds in microcavities.

AB - The role of the electric field during manipulations with diamond nanoparticles on a silicon substrate by a scanning probe microscope (SPM) tip is studied. It is found that the attractive force appearing in the contact between nanodiamond and an electrically charged tip is sufficient to detach and displace a chosen nanoparticle from initial to goal position under moderate mechanical stresses of the probe to nanoparticle. The problem of the control of the tip motion trajectory during manipulations is solved by visualizing the tip trace of the sample surface. The results obtained will be used for precision positioning of single-photon emitters based on luminescent nanodiamonds in microcavities.

KW - SPM tip

KW - electric field

KW - manipulations

KW - nanodiamond

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JF - Bulletin of the Lebedev Physics Institute

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Manipulations with diamond nanoparticles in SPM: the effect of electric field of the conductive probe tip

Abstract

Keywords

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