Manipulations with diamond nanoparticles in SPM: the effect of electric field of the conductive probe tip

V. D. Frolov, V. A. Shershulin, E. V. Zavedeeev, P. A. Pivovarov, M. S. Komlenok, Robert Nemanich, V. I. Konov, I. I. Vlasov

Research output: Contribution to journalArticle

Abstract

The role of the electric field during manipulations with diamond nanoparticles on a silicon substrate by a scanning probe microscope (SPM) tip is studied. It is found that the attractive force appearing in the contact between nanodiamond and an electrically charged tip is sufficient to detach and displace a chosen nanoparticle from initial to goal position under moderate mechanical stresses of the probe to nanoparticle. The problem of the control of the tip motion trajectory during manipulations is solved by visualizing the tip trace of the sample surface. The results obtained will be used for precision positioning of single-photon emitters based on luminescent nanodiamonds in microcavities.

Original languageEnglish (US)
Pages (from-to)356-360
Number of pages5
JournalBulletin of the Lebedev Physics Institute
Volume43
Issue number12
DOIs
StatePublished - Dec 1 2016

Keywords

  • electric field
  • manipulations
  • nanodiamond
  • SPM tip

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Frolov, V. D., Shershulin, V. A., Zavedeeev, E. V., Pivovarov, P. A., Komlenok, M. S., Nemanich, R., Konov, V. I., & Vlasov, I. I. (2016). Manipulations with diamond nanoparticles in SPM: the effect of electric field of the conductive probe tip. Bulletin of the Lebedev Physics Institute, 43(12), 356-360. https://doi.org/10.3103/S1068335616120046