Magnetically driven atomic force microscope for precision interfacial force measurements

Wenhai Han, Stuart Lindsay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Force spectroscopy of the MAC Mode atomic mode microscope (AFM) has been used to probe ordered liquid molecules of OMCTS and mesitylene at the graphite surface with sub-angstrom vertical distance resolution. The interaction force obtained from the spectra showed details well under 1 pN, more than one order of magnitude better than what a conventional contact mode AFM can resolve. Elastic compliance at the center of each layer was found to exponentially decrease versus the number of layers.

Original languageEnglish (US)
Title of host publicationAmerican Chemical Society, Polymer Preprints, Division of Polymer Chemistry
Editors Anon
PublisherACS
Pages1195-1196
Number of pages2
Volume39
Edition2
StatePublished - Aug 1998
Externally publishedYes
EventProceedings of the 1997 Boston Meeting - Boston, MA, USA
Duration: Aug 23 1998Aug 27 1998

Other

OtherProceedings of the 1997 Boston Meeting
CityBoston, MA, USA
Period8/23/988/27/98

ASJC Scopus subject areas

  • Polymers and Plastics

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