MAGNETIC SECTOR ATOM-PROBE FIELD ION MICROSCOPE WITH A RETARDING POTENTIAL ANALYZER.

Robert J. Culbertson, Toshio Sakurai

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

A combination of a magnetic sector atom-probe field ion microscope and a filter-lens-type retarding potential analyzer makes possible the investigation of the energy distribution of field desorption as well as field ionization and the field ion energy deficit with respect to the emitter potential on an absolute energy scale. The performance of this analyzer was evaluated using various imaging gases, and its resolution is estimated to be better than 100 meV out of a 2000 eV primary energy.

Original languageEnglish (US)
Pages (from-to)1752-1755
Number of pages4
JournalJ VAC SCI TECHNOL
Volume15
Issue number5
DOIs
StatePublished - Jan 1 1978
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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