Abstract
We have developed a novel magnetic force microscope (MFM) utilizing a vertically cantilevered microtip probe. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections (tip crashes). We demonstrate the capability of our MFM by imaging domain structure in prerecorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.
Original language | English (US) |
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Pages (from-to) | 2108-2110 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 61 |
Issue number | 17 |
DOIs | |
State | Published - 1992 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)