Magnetic force microscopy utilizing an ultrasensitive vertical cantilever geometry

A. Dicarlo, M. R. Scheinfein, Ralph Chamberlin

Research output: Contribution to journalArticlepeer-review

19 Scopus citations


We have developed a novel magnetic force microscope (MFM) utilizing a vertically cantilevered microtip probe. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections (tip crashes). We demonstrate the capability of our MFM by imaging domain structure in prerecorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.

Original languageEnglish (US)
Pages (from-to)2108-2110
Number of pages3
JournalApplied Physics Letters
Issue number17
StatePublished - Dec 1 1992

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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