We have developed a novel vertical cantilever geometry for scanning force microscopy. The vertical cantilever has several advantages over horizontal cantilever designs. The vertical cantilever is sensitive to vertical forces and horizontal force gradients; its lateral response is inherently directional; and the vertical geometry inhibits uncontrolled vertical deflections, thereby reducing the incidence of tip crashes and facilitating the use of ultra-small-spring-constant cantilevers for superior force sensitivity. We have constructed a magnetic force microscope (MFM) utilizing the vertical cantilever geometry. Images of magnetic recording media are used to illustrate the capabilities of our MFM.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics