Magnetic Force and Force gradient microscopy utilizing an ultra-sensitive vertical cantilever geometry

A. Dicarlo; M. R. Scheinfein; R. V. Chamberlin

doi:10.1117/12.146376

Magnetic Force and Force gradient microscopy utilizing an ultra-sensitive vertical cantilever geometry

A. Dicarlo, M. R. Scheinfein, R. V. Chamberlin

Physics

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

We have developed a novel Magnetic Force Microscope (MFM) utilizing a vertically cantilevered microprobe tip. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections. We demonstrate the capability of our MFM by imaging domain structure in pre-recorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.

Original language	English (US)
Pages (from-to)	187-194
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1855
DOIs	https://doi.org/10.1117/12.146376
State	Published - Jun 4 1993
Event	Scanning Probe Microscopies II 1993 - Los Angeles, United States Duration: Jan 17 1993 → Jan 22 1993

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.146376

Cite this

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abstract = "We have developed a novel Magnetic Force Microscope (MFM) utilizing a vertically cantilevered microprobe tip. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections. We demonstrate the capability of our MFM by imaging domain structure in pre-recorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.",

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AU - Dicarlo, A.

AU - Scheinfein, M. R.

AU - Chamberlin, R. V.

PY - 1993/6/4

Y1 - 1993/6/4

N2 - We have developed a novel Magnetic Force Microscope (MFM) utilizing a vertically cantilevered microprobe tip. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections. We demonstrate the capability of our MFM by imaging domain structure in pre-recorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.

AB - We have developed a novel Magnetic Force Microscope (MFM) utilizing a vertically cantilevered microprobe tip. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections. We demonstrate the capability of our MFM by imaging domain structure in pre-recorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.

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M3 - Conference article

AN - SCOPUS:8944225382

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EP - 194

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Scanning Probe Microscopies II 1993

Y2 - 17 January 1993 through 22 January 1993

ER -

Magnetic Force and Force gradient microscopy utilizing an ultra-sensitive vertical cantilever geometry

Abstract

ASJC Scopus subject areas

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