Magnetic Force and Force gradient microscopy utilizing an ultra-sensitive vertical cantilever geometry

A. Dicarlo, M. R. Scheinfein, R. V. Chamberlin

Research output: Contribution to journalConference article

2 Scopus citations

Abstract

We have developed a novel Magnetic Force Microscope (MFM) utilizing a vertically cantilevered microprobe tip. This new geometry provides maximum sensitivity while inhibiting uncontrolled vertical deflections. We demonstrate the capability of our MFM by imaging domain structure in pre-recorded magnetic tape and domain walls in single-crystal iron whiskers. Good agreement is obtained between the observed magnetic contrast and predictions of a micromagnetic model.

Original languageEnglish (US)
Pages (from-to)187-194
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume1855
DOIs
StatePublished - Jun 4 1993
Externally publishedYes
EventScanning Probe Microscopies II 1993 - Los Angeles, United States
Duration: Jan 17 1993Jan 22 1993

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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