Lower limits of detection for single biological particles using impedance spectroscopy

Pahnit Seriburi, Ashutosh Shastry, Angelique Van't Wout, John Mittler, Shih Hui Chao, John Koschwanez, Deirdre Meldrum

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Single-cell impedance spectroscopy integrated with lab-on-a-chip systems provides a direct and minimally invasive approach for monitoring and characterizing properties of individual cells in real-time. Here we investigate the theoretical potential and limitations of this technique for analyzing single membrane-bound particles as small as 100 nm in diameter. Our theoretical model suggests a lower limit of detection for single cells on the order of a few microns.

Original languageEnglish (US)
Title of host publicationProceedings of the 4th ASME Integrated Nanosystems Conference
Subtitle of host publicationDesign, Synthesis, and Applications
PublisherAmerican Society of Mechanical Engineers
Pages17-18
Number of pages2
ISBN (Print)0791842088, 9780791842089
DOIs
StatePublished - 2005
Externally publishedYes
Event4th ASME Integrated Nanosystems Conference: Design, Synthesis, and Applications - Berkeley, CA, United States
Duration: Sep 14 2005Sep 16 2005

Publication series

Name2005 Proceedings of the 4th ASME Conference on Integrated Nanosystems: Design, Synthesis, and Applications

Other

Other4th ASME Integrated Nanosystems Conference: Design, Synthesis, and Applications
CountryUnited States
CityBerkeley, CA
Period9/14/059/16/05

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Seriburi, P., Shastry, A., Van't Wout, A., Mittler, J., Chao, S. H., Koschwanez, J., & Meldrum, D. (2005). Lower limits of detection for single biological particles using impedance spectroscopy. In Proceedings of the 4th ASME Integrated Nanosystems Conference: Design, Synthesis, and Applications (pp. 17-18). (2005 Proceedings of the 4th ASME Conference on Integrated Nanosystems: Design, Synthesis, and Applications). American Society of Mechanical Engineers. https://doi.org/10.1115/nano2005-87060