Abstract
Thermionic electron emission is a key phenomenon utilized in a variety of applications, from communications, space propulsion to direct energy conversion. Doped diamond films with a negative electron affinity (NEA) surface characteristic present a reduced effective work function for electron emission. Our prior research has indicated a work function of ∼ 1.5 eV for nitrogen doped diamond films prepared by microwave plasma CVD. The focus of this study is on the role of the interfacial or nucleation layer. A thermionic emitter was fabricated with a nitrogen incorporated ultra-nanocrystalline diamond (UNCD) nucleation layer and a nitrogen doped diamond surface layer with hydrogen termination. The film exhibited a resistance that decreased with temperature suggesting the role of the dopant, and thermionic electron emission was observed at temperatures < 250 °C. An analysis based on the Richardson-Dushman equation indicated an emission barrier of < 1.3 eV with a Richardson constant of ∼ 0.8 A/cm2 K2.
Original language | English (US) |
---|---|
Pages (from-to) | 232-234 |
Number of pages | 3 |
Journal | Diamond and Related Materials |
Volume | 18 |
Issue number | 2-3 |
DOIs | |
State | Published - Feb 2009 |
Keywords
- Chemical vapor deposition
- Diamond growth
- Doping
- Field emission
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Chemistry(all)
- Mechanical Engineering
- Materials Chemistry
- Electrical and Electronic Engineering