Low-temperature luminescence of exciton and defect states in heteroepitaxial GaN grown by hydride vapor phase epitaxy

Brian Skromme, J. Jayapalan, R. P. Vaudo, V. M. Phanse

Research output: Contribution to journalArticlepeer-review

65 Scopus citations

Abstract

The photoluminescence spectra of a thick layer of heteroepitaxial GaN, which has an exceptionally low dislocation density of 3×106 is presented. Analysis of this structure gives data on the excitonic and impurity states. The undoped sample was grown by hydride vapor phase epitaxy (HVPE) on sapphire(0001) using HCl, metallic Ga, and NH3 as precursors. The spectra permits identification of n = 2 and three two-electron satellites involving up to five donor species with ionization energies from 22 to 34.5 meV. The free exciton binding energy confirmed as 26.4 meV, independent of strain.

Original languageEnglish (US)
Pages (from-to)2358-2360
Number of pages3
JournalApplied Physics Letters
Volume74
Issue number16
DOIs
StatePublished - Apr 19 1999

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint Dive into the research topics of 'Low-temperature luminescence of exciton and defect states in heteroepitaxial GaN grown by hydride vapor phase epitaxy'. Together they form a unique fingerprint.

Cite this