Low temperature ion beam mixing of bilayers and multilayers in the Ti-Cu system

P. Børgesen, T. L. Alford, D. A. Lilienfeld, H. H. Johnson

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

The mixing rate for Ti-Cu bilayers irradiated by 600 keV Xe ions near liquidnitrogen temperature was found to be a factor of 1.6 smaller than estimated on the basis of a cylindrical thermal spike model. At room temperature radiation enhanced diffusion contributes measurably to the mixing. As was found previously for Fe-Ti and Ni-Ti samples, mixing was found to be considerably faster at the Cu-Ti interfaces of a multilayer sample.

Original languageEnglish (US)
Pages (from-to)161-164
Number of pages4
JournalApplied Physics A Solids and Surfaces
Volume50
Issue number2
DOIs
StatePublished - Feb 1 1990
Externally publishedYes

Keywords

  • 81.20

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)
  • Physics and Astronomy (miscellaneous)

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