Low temperature ion beam mixing of bilayers and multilayers in the Ti-Cu system

P. Borgesen, Terry Alford, D. A. Lilienfeld, H. H. Johnson

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

The mixing rate for Ti-Cu bilayers irradiated by 600 keV Xe ions near liquid-nitrogen temperature was found to be a factor of 1.6 smaller than estimated on the basis of a cylindrical thermal spike model. At room temperature radiation enhanced diffusion contributes measurably to the mixing. As was found previously for Fe-Ti and Ni-Ti samples, mixing was found to be considerably faster at the Cu-Ti interfaces of a multilayer sample.

Original languageEnglish (US)
Pages (from-to)161-164
Number of pages4
JournalApplied Physics A: Solids and Surfaces
Volume50
Issue number2
StatePublished - Feb 1990
Externally publishedYes

Fingerprint

Ion beams
Multilayers
ion beams
Liquid nitrogen
spikes
liquid nitrogen
Temperature
Ions
Radiation
room temperature
radiation
ions
temperature
titanium nickelide
Hot Temperature

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Materials Science(all)

Cite this

Low temperature ion beam mixing of bilayers and multilayers in the Ti-Cu system. / Borgesen, P.; Alford, Terry; Lilienfeld, D. A.; Johnson, H. H.

In: Applied Physics A: Solids and Surfaces, Vol. 50, No. 2, 02.1990, p. 161-164.

Research output: Contribution to journalArticle

Borgesen, P. ; Alford, Terry ; Lilienfeld, D. A. ; Johnson, H. H. / Low temperature ion beam mixing of bilayers and multilayers in the Ti-Cu system. In: Applied Physics A: Solids and Surfaces. 1990 ; Vol. 50, No. 2. pp. 161-164.
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