Low-temperature crystallization and ferroelectric properties of sol-gel derived layer-structured perovskite thin films

Kazumi Kato, Jeffrey Michael Finder, Sandwip Dey, Yasuyoshi Torii

Research output: Chapter in Book/Report/Conference proceedingChapter

11 Scopus citations

Abstract

The sol-gel derived SBT thin films crystallized, by rapid thermal annealing in an oxygen atmosphere below 550°C, and exhibited preferred (115) orientation. The crystalline perfection improved and the crystallite size increased with temperature up to 700°C. In the case of SBN thin films, a low heating rate of 2°C/min, was necessary for the control of the crystallographic (115) orientation, whereas a rate of 200°C/s (rapid thermal annealing) exhibited a c-axis orientation. The (115) SBT thin film, heated to 700°C, exhibited improved ferroelectric properties.

Original languageEnglish (US)
Title of host publicationIntegrated Ferroelectrics
Pages237-247
Number of pages11
Volume18
Edition1-4
StatePublished - 1998

Keywords

  • Fatigue properties
  • Hysteresis loops
  • Preferred orientation
  • Sol-gel processing
  • SrBi Ta O -SrBi Nb O
  • Stoichiometric composition

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy (miscellaneous)
  • Condensed Matter Physics

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  • Cite this

    Kato, K., Finder, J. M., Dey, S., & Torii, Y. (1998). Low-temperature crystallization and ferroelectric properties of sol-gel derived layer-structured perovskite thin films. In Integrated Ferroelectrics (1-4 ed., Vol. 18, pp. 237-247)