Abstract
Spherical aberration (Cs) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions Cs-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.
Original language | English (US) |
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Pages (from-to) | 1636-1644 |
Number of pages | 9 |
Journal | Ultramicroscopy |
Volume | 108 |
Issue number | 12 |
DOIs | |
State | Published - Nov 2008 |
Externally published | Yes |
Keywords
- Aberration correction
- Cryo-EM
- Electron microscopy
- TEM
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation