Low-dose aberration corrected cryo-electron microscopy of organic specimens

James E. Evans; Crispin Hetherington; Angus Kirkland; Lan Yun Chang; Henning Stahlberg; Nigel Browning

doi:10.1016/j.ultramic.2008.06.004

Low-dose aberration corrected cryo-electron microscopy of organic specimens

James E. Evans, Crispin Hetherington, Angus Kirkland, Lan Yun Chang, Henning Stahlberg, Nigel Browning

Research output: Contribution to journal › Article › peer-review

40 Scopus citations

Abstract

Spherical aberration (C_s) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C_s-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

Original language	English (US)
Pages (from-to)	1636-1644
Number of pages	9
Journal	Ultramicroscopy
Volume	108
Issue number	12
DOIs	https://doi.org/10.1016/j.ultramic.2008.06.004
State	Published - Nov 2008
Externally published	Yes

Keywords

Aberration correction
Cryo-EM
Electron microscopy
TEM

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/j.ultramic.2008.06.004

Cite this

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title = "Low-dose aberration corrected cryo-electron microscopy of organic specimens",

abstract = "Spherical aberration (Cs) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions Cs-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.",

keywords = "Aberration correction, Cryo-EM, Electron microscopy, TEM",

author = "Evans, {James E.} and Crispin Hetherington and Angus Kirkland and Chang, {Lan Yun} and Henning Stahlberg and Nigel Browning",

note = "Funding Information: The authors are grateful to R. Glaeser, D. Typke for providing the paraffin solution and for relevant discussions. This work was supported by the National Institute of Health (training Grant P32-GM07377) and by the US Department of Energy (Grant no. DE-FG02-03ER46057). AIK acknowledges financial support from the Engineering and Physical Sciences Research Council and from the Leverhulme Trust.",

year = "2008",

month = nov,

doi = "10.1016/j.ultramic.2008.06.004",

language = "English (US)",

volume = "108",

pages = "1636--1644",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "12",

}

TY - JOUR

T1 - Low-dose aberration corrected cryo-electron microscopy of organic specimens

AU - Evans, James E.

AU - Hetherington, Crispin

AU - Kirkland, Angus

AU - Chang, Lan Yun

AU - Stahlberg, Henning

AU - Browning, Nigel

N1 - Funding Information: The authors are grateful to R. Glaeser, D. Typke for providing the paraffin solution and for relevant discussions. This work was supported by the National Institute of Health (training Grant P32-GM07377) and by the US Department of Energy (Grant no. DE-FG02-03ER46057). AIK acknowledges financial support from the Engineering and Physical Sciences Research Council and from the Leverhulme Trust.

PY - 2008/11

Y1 - 2008/11

N2 - Spherical aberration (Cs) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions Cs-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

AB - Spherical aberration (Cs) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions Cs-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

KW - Aberration correction

KW - Cryo-EM

KW - Electron microscopy

KW - TEM

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UR - http://www.scopus.com/inward/citedby.url?scp=53249098416&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2008.06.004

DO - 10.1016/j.ultramic.2008.06.004

M3 - Article

C2 - 18703285

AN - SCOPUS:53249098416

SN - 0304-3991

VL - 108

SP - 1636

EP - 1644

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 12

ER -

Low-dose aberration corrected cryo-electron microscopy of organic specimens

Abstract

Keywords

ASJC Scopus subject areas

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