Low-dose aberration corrected cryo-electron microscopy of organic specimens

James E. Evans, Crispin Hetherington, Angus Kirkland, Lan-Yun Chang, Henning Stahlberg, Nigel Browning

Research output: Contribution to journalArticle

31 Citations (Scopus)

Abstract

Spherical aberration (C s) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C s-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

Original languageEnglish (US)
Pages (from-to)1636-1644
Number of pages9
JournalUltramicroscopy
Volume108
Issue number12
DOIs
StatePublished - Nov 1 2008
Externally publishedYes

Fingerprint

Aberrations
Electron microscopy
aberration
electron microscopy
Imaging techniques
dosage
Liquid nitrogen
Microscopes
Electron microscopes
inorganic materials
Lighting
organic materials
Radiation
liquid nitrogen
Electrons
electron microscopes
illumination
microscopes
radiation
Temperature

Keywords

  • Aberration correction
  • Cryo-EM
  • Electron microscopy
  • TEM

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

Cite this

Evans, J. E., Hetherington, C., Kirkland, A., Chang, L-Y., Stahlberg, H., & Browning, N. (2008). Low-dose aberration corrected cryo-electron microscopy of organic specimens. Ultramicroscopy, 108(12), 1636-1644. https://doi.org/10.1016/j.ultramic.2008.06.004

Low-dose aberration corrected cryo-electron microscopy of organic specimens. / Evans, James E.; Hetherington, Crispin; Kirkland, Angus; Chang, Lan-Yun; Stahlberg, Henning; Browning, Nigel.

In: Ultramicroscopy, Vol. 108, No. 12, 01.11.2008, p. 1636-1644.

Research output: Contribution to journalArticle

Evans, JE, Hetherington, C, Kirkland, A, Chang, L-Y, Stahlberg, H & Browning, N 2008, 'Low-dose aberration corrected cryo-electron microscopy of organic specimens', Ultramicroscopy, vol. 108, no. 12, pp. 1636-1644. https://doi.org/10.1016/j.ultramic.2008.06.004
Evans, James E. ; Hetherington, Crispin ; Kirkland, Angus ; Chang, Lan-Yun ; Stahlberg, Henning ; Browning, Nigel. / Low-dose aberration corrected cryo-electron microscopy of organic specimens. In: Ultramicroscopy. 2008 ; Vol. 108, No. 12. pp. 1636-1644.
@article{eddd0072cf574d7ea233349e3dd24194,
title = "Low-dose aberration corrected cryo-electron microscopy of organic specimens",
abstract = "Spherical aberration (C s) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C s-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.",
keywords = "Aberration correction, Cryo-EM, Electron microscopy, TEM",
author = "Evans, {James E.} and Crispin Hetherington and Angus Kirkland and Lan-Yun Chang and Henning Stahlberg and Nigel Browning",
year = "2008",
month = "11",
day = "1",
doi = "10.1016/j.ultramic.2008.06.004",
language = "English (US)",
volume = "108",
pages = "1636--1644",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "12",

}

TY - JOUR

T1 - Low-dose aberration corrected cryo-electron microscopy of organic specimens

AU - Evans, James E.

AU - Hetherington, Crispin

AU - Kirkland, Angus

AU - Chang, Lan-Yun

AU - Stahlberg, Henning

AU - Browning, Nigel

PY - 2008/11/1

Y1 - 2008/11/1

N2 - Spherical aberration (C s) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C s-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

AB - Spherical aberration (C s) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C s-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

KW - Aberration correction

KW - Cryo-EM

KW - Electron microscopy

KW - TEM

UR - http://www.scopus.com/inward/record.url?scp=53249098416&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=53249098416&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2008.06.004

DO - 10.1016/j.ultramic.2008.06.004

M3 - Article

VL - 108

SP - 1636

EP - 1644

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 12

ER -