Low-dose aberration corrected cryo-electron microscopy of organic specimens

James E. Evans, Crispin Hetherington, Angus Kirkland, Lan-Yun Chang, Henning Stahlberg, Nigel Browning

Research output: Contribution to journalArticle

32 Scopus citations

Abstract

Spherical aberration (C s) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C s-correction can provide a significant improvement in resolution (to less than 0.16 nm) for direct imaging of organic samples.

Original languageEnglish (US)
Pages (from-to)1636-1644
Number of pages9
JournalUltramicroscopy
Volume108
Issue number12
DOIs
StatePublished - Nov 1 2008
Externally publishedYes

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Keywords

  • Aberration correction
  • Cryo-EM
  • Electron microscopy
  • TEM

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

Cite this

Evans, J. E., Hetherington, C., Kirkland, A., Chang, L-Y., Stahlberg, H., & Browning, N. (2008). Low-dose aberration corrected cryo-electron microscopy of organic specimens. Ultramicroscopy, 108(12), 1636-1644. https://doi.org/10.1016/j.ultramic.2008.06.004