Low-cost spray deposited ZrO2 for passivation and antireflection on p-type Si

Woo Jung Shin; Laidong Wang; Meng Tao

doi:10.1109/PVSC.2016.7750206

Low-cost spray deposited ZrO₂ for passivation and antireflection on p-type Si

Woo Jung Shin, Laidong Wang, Meng Tao

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

In this study, we use low-cost spray deposition to study the possibility of using an earth-abundant ZrO₂ film as a antireflection and passivation layer on p-type Si. Structural, optical and electrical properties of the spray-deposited ZrO2 film were investigated. Spray deposited ZrO₂ is highly transparent with a refractive index of 2 at 600 nm wavelength. Reflectance and transmittance spectra of ZrO2 films reveal that the optical properties of spray-deposited ZrO₂ are comparable to, and in some cases slightly better than, PECVD SiNx. Capacitance-voltage measurements show that spray-deposited ZrO2 films have negative charges with a charge density of 1.07×10¹² cm^-2. These results suggest that spray-deposited ZrO₂ could be a suitable material for antireflection and passivation on p-type Si in Si solar cells.

Original language	English (US)
Title of host publication	2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	2971-2974
Number of pages	4
Volume	2016-November
ISBN (Electronic)	9781509027248
DOIs	https://doi.org/10.1109/PVSC.2016.7750206
State	Published - Nov 18 2016
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: Jun 5 2016 → Jun 10 2016

Other

Other	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country	United States
City	Portland
Period	6/5/16 → 6/10/16

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2016.7750206

Fingerprint Dive into the research topics of 'Low-cost spray deposited ZrO<sub>2</sub> for passivation and antireflection on p-type Si'. Together they form a unique fingerprint.

Cite this

Shin, W. J., Wang, L., & Tao, M. (2016). Low-cost spray deposited ZrO₂ for passivation and antireflection on p-type Si. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 (Vol. 2016-November, pp. 2971-2974). [7750206] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2016.7750206

Low-cost spray deposited ZrO₂ for passivation and antireflection on p-type Si. / Shin, Woo Jung; Wang, Laidong; Tao, Meng.

2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Vol. 2016-November Institute of Electrical and Electronics Engineers Inc., 2016. p. 2971-2974 7750206.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Shin, WJ, Wang, L & Tao, M 2016, Low-cost spray deposited ZrO₂ for passivation and antireflection on p-type Si. in 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. vol. 2016-November, 7750206, Institute of Electrical and Electronics Engineers Inc., pp. 2971-2974, 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 6/5/16. https://doi.org/10.1109/PVSC.2016.7750206

@inproceedings{7423ac7a9ab346a3b914ca2c667a5ae3,

title = "Low-cost spray deposited ZrO2 for passivation and antireflection on p-type Si",

abstract = "In this study, we use low-cost spray deposition to study the possibility of using an earth-abundant ZrO2 film as a antireflection and passivation layer on p-type Si. Structural, optical and electrical properties of the spray-deposited ZrO2 film were investigated. Spray deposited ZrO2 is highly transparent with a refractive index of 2 at 600 nm wavelength. Reflectance and transmittance spectra of ZrO2 films reveal that the optical properties of spray-deposited ZrO2 are comparable to, and in some cases slightly better than, PECVD SiNx. Capacitance-voltage measurements show that spray-deposited ZrO2 films have negative charges with a charge density of 1.07×1012 cm-2. These results suggest that spray-deposited ZrO2 could be a suitable material for antireflection and passivation on p-type Si in Si solar cells.",

author = "Shin, {Woo Jung} and Laidong Wang and Meng Tao",

year = "2016",

month = nov,

day = "18",

doi = "10.1109/PVSC.2016.7750206",

language = "English (US)",

volume = "2016-November",

pages = "2971--2974",

booktitle = "2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

}

TY - GEN

T1 - Low-cost spray deposited ZrO2 for passivation and antireflection on p-type Si

AU - Shin, Woo Jung

AU - Wang, Laidong

AU - Tao, Meng

PY - 2016/11/18

Y1 - 2016/11/18

N2 - In this study, we use low-cost spray deposition to study the possibility of using an earth-abundant ZrO2 film as a antireflection and passivation layer on p-type Si. Structural, optical and electrical properties of the spray-deposited ZrO2 film were investigated. Spray deposited ZrO2 is highly transparent with a refractive index of 2 at 600 nm wavelength. Reflectance and transmittance spectra of ZrO2 films reveal that the optical properties of spray-deposited ZrO2 are comparable to, and in some cases slightly better than, PECVD SiNx. Capacitance-voltage measurements show that spray-deposited ZrO2 films have negative charges with a charge density of 1.07×1012 cm-2. These results suggest that spray-deposited ZrO2 could be a suitable material for antireflection and passivation on p-type Si in Si solar cells.

AB - In this study, we use low-cost spray deposition to study the possibility of using an earth-abundant ZrO2 film as a antireflection and passivation layer on p-type Si. Structural, optical and electrical properties of the spray-deposited ZrO2 film were investigated. Spray deposited ZrO2 is highly transparent with a refractive index of 2 at 600 nm wavelength. Reflectance and transmittance spectra of ZrO2 films reveal that the optical properties of spray-deposited ZrO2 are comparable to, and in some cases slightly better than, PECVD SiNx. Capacitance-voltage measurements show that spray-deposited ZrO2 films have negative charges with a charge density of 1.07×1012 cm-2. These results suggest that spray-deposited ZrO2 could be a suitable material for antireflection and passivation on p-type Si in Si solar cells.

UR - http://www.scopus.com/inward/record.url?scp=85003678371&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85003678371&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2016.7750206

DO - 10.1109/PVSC.2016.7750206

M3 - Conference contribution

AN - SCOPUS:85003678371

VL - 2016-November

SP - 2971

EP - 2974

BT - 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016

Y2 - 5 June 2016 through 10 June 2016

ER -