Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor

Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only relevant fault model. The delay fault model - which assumes that the faulty circuit element gets the correct value but that this value arrives too late - encompasses many of the actual in-field wearout faults in modern microprocessors. In-field wearout faults, such as time-dependent dielectric breakdown and electromigration, cause signal propagation delays which may be missed during production test time. These defects progress exponentially over time, potentially causing a catastrophic failure. Our goal is to diagnose hard delay faults (i.e., identify them as hard faults, not transients) during run-time before they lead to catastrophic chip failures. Results show that we can diagnose all injected delay faults and that prior diagnosis mechanisms, which target only stuck-at faults, miss the majority of them.

Original languageEnglish (US)
Title of host publication2007 IEEE International Conference on Computer Design, ICCD 2007
Pages317-324
Number of pages8
DOIs
StatePublished - 2007
Externally publishedYes
Event2007 IEEE International Conference on Computer Design, ICCD 2007 - Lake Tahoe, CA, United States
Duration: Oct 7 2007Oct 10 2007

Other

Other2007 IEEE International Conference on Computer Design, ICCD 2007
CountryUnited States
CityLake Tahoe, CA
Period10/7/0710/10/07

Fingerprint

Microprocessor chips
Costs
Electromigration
Electric breakdown
Defects
Networks (circuits)

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

Cite this

Ozev, S., Sorin, D. J., & Yilmaz, M. (2007). Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. In 2007 IEEE International Conference on Computer Design, ICCD 2007 (pp. 317-324). [4601919] https://doi.org/10.1109/ICCD.2007.4601919

Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. / Ozev, Sule; Sorin, Daniel J.; Yilmaz, Mahmut.

2007 IEEE International Conference on Computer Design, ICCD 2007. 2007. p. 317-324 4601919.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ozev, S, Sorin, DJ & Yilmaz, M 2007, Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. in 2007 IEEE International Conference on Computer Design, ICCD 2007., 4601919, pp. 317-324, 2007 IEEE International Conference on Computer Design, ICCD 2007, Lake Tahoe, CA, United States, 10/7/07. https://doi.org/10.1109/ICCD.2007.4601919
Ozev S, Sorin DJ, Yilmaz M. Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. In 2007 IEEE International Conference on Computer Design, ICCD 2007. 2007. p. 317-324. 4601919 https://doi.org/10.1109/ICCD.2007.4601919
Ozev, Sule ; Sorin, Daniel J. ; Yilmaz, Mahmut. / Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. 2007 IEEE International Conference on Computer Design, ICCD 2007. 2007. pp. 317-324
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