Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor

Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only relevant fault model. The delay fault model - which assumes that the faulty circuit element gets the correct value but that this value arrives too late - encompasses many of the actual in-field wearout faults in modern microprocessors. In-field wearout faults, such as time-dependent dielectric breakdown and electromigration, cause signal propagation delays which may be missed during production test time. These defects progress exponentially over time, potentially causing a catastrophic failure. Our goal is to diagnose hard delay faults (i.e., identify them as hard faults, not transients) during run-time before they lead to catastrophic chip failures. Results show that we can diagnose all injected delay faults and that prior diagnosis mechanisms, which target only stuck-at faults, miss the majority of them.

Original languageEnglish (US)
Title of host publication2007 IEEE International Conference on Computer Design, ICCD 2007
Pages317-324
Number of pages8
DOIs
StatePublished - Dec 1 2007
Externally publishedYes
Event2007 IEEE International Conference on Computer Design, ICCD 2007 - Lake Tahoe, CA, United States
Duration: Oct 7 2007Oct 10 2007

Publication series

Name2007 IEEE International Conference on Computer Design, ICCD 2007

Other

Other2007 IEEE International Conference on Computer Design, ICCD 2007
CountryUnited States
CityLake Tahoe, CA
Period10/7/0710/10/07

ASJC Scopus subject areas

  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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    Ozev, S., Sorin, D. J., & Yilmaz, M. (2007). Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor. In 2007 IEEE International Conference on Computer Design, ICCD 2007 (pp. 317-324). [4601919] (2007 IEEE International Conference on Computer Design, ICCD 2007). https://doi.org/10.1109/ICCD.2007.4601919