Low cost MIMO testing for RF integrated circuits

Erkan Acar, Sule Ozev

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Multiple-inputmultiple-output (MIMO)-based systems are extremely popular as they offer data rates as twice as fast as currently available systems. Their testing becomes more complicated due to the increased number of RF paths. This increases the overall test cost of these devices both in terms of test time and instrumentation cost. In this paper, we demonstrate a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, IIP3, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of these performance parameters. Using the proposed test method, RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry within a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.

Original languageEnglish (US)
Article number5280186
Pages (from-to)1348-1356
Number of pages9
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume18
Issue number9
DOIs
StatePublished - Sep 2010

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Integrated circuits
Testing
Costs
Specifications

Keywords

  • Multiple-inputmultiple-output (MIMO) RF testing
  • orthogonal frequency domain multiplexing (OFDM)
  • WLAN

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Hardware and Architecture
  • Software

Cite this

Low cost MIMO testing for RF integrated circuits. / Acar, Erkan; Ozev, Sule.

In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 18, No. 9, 5280186, 09.2010, p. 1348-1356.

Research output: Contribution to journalArticle

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