TY - JOUR
T1 - Low cost MIMO testing for RF integrated circuits
AU - Acar, Erkan
AU - Ozev, Sule
N1 - Funding Information:
Manuscript received September 04, 2008; revised April 21, 2009; accepted April 26, 2009. First published October 06, 2009; current version published August 25, 2010. This work was supported in part by the Semiconductor Research Corporation under Contract 2004-TJ-1247 and by the National Science Foundation under Contracts CCF-0545456 and CCF-0540994.
PY - 2010/9
Y1 - 2010/9
N2 - Multiple-inputmultiple-output (MIMO)-based systems are extremely popular as they offer data rates as twice as fast as currently available systems. Their testing becomes more complicated due to the increased number of RF paths. This increases the overall test cost of these devices both in terms of test time and instrumentation cost. In this paper, we demonstrate a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, IIP3, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of these performance parameters. Using the proposed test method, RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry within a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.
AB - Multiple-inputmultiple-output (MIMO)-based systems are extremely popular as they offer data rates as twice as fast as currently available systems. Their testing becomes more complicated due to the increased number of RF paths. This increases the overall test cost of these devices both in terms of test time and instrumentation cost. In this paper, we demonstrate a low cost MIMO test solution which targets critical specifications that are fundamental to the MIMO system operation, such as gain, IIP3, and phase imbalances between the RF paths. Our test methodology measures these parameters with a single test setup that enables the calculation of these performance parameters. Using the proposed test method, RF MIMO systems can be tested using a mixed signal tester, and on-board circuitry within a reasonable accuracy. Both simulation and measurement results confirm the high accuracy and repeatability of our test technique.
KW - Multiple-inputmultiple-output (MIMO) RF testing
KW - WLAN
KW - orthogonal frequency domain multiplexing (OFDM)
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U2 - 10.1109/TVLSI.2009.2024018
DO - 10.1109/TVLSI.2009.2024018
M3 - Article
AN - SCOPUS:77956219886
SN - 1063-8210
VL - 18
SP - 1348
EP - 1356
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IS - 9
M1 - 5280186
ER -