Low cost characterization of RF transceivers through IQ data analysis

Erkan Acar, Sule Ozev

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

As Radio Frequency (RF) devices become more complex and the integration levels increase, their testing becomes more challenging. In order to guarantee successful operation and compliance to certain specifications, measurement of a large number performance parameters under the prescribed operation conditions is needed. Such detailed characterization typically necessitates long test times and expensive instrumentation, increasing the test cost. In this paper, we present a low cost test methodology that determines the RF device's vital performance parameters, such as path gain, IIP3, quadrature imbalances, noise, bit error rate (BER), and error vector magnitude (EVM) through a single test setup. The proposed test methodology is applicable for both single carrier systems and multi-carrier systems. Simulation and measurement results indicate that these performance parameters can be calculated and estimated accurately through a single test set-up and using a shorter test sequence than required by traditional techniques.

Original languageEnglish (US)
Title of host publicationProceedings - International Test Conference
DOIs
StatePublished - 2008
Externally publishedYes
Event2007 IEEE International Test Conference, ITC - Santa Clara, CA, United States
Duration: Oct 23 2007Oct 25 2007

Other

Other2007 IEEE International Test Conference, ITC
CountryUnited States
CitySanta Clara, CA
Period10/23/0710/25/07

Fingerprint

Transceivers
Bit error rate
Costs
Specifications
Testing
Compliance

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Low cost characterization of RF transceivers through IQ data analysis. / Acar, Erkan; Ozev, Sule.

Proceedings - International Test Conference. 2008. 4437641.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Acar, E & Ozev, S 2008, Low cost characterization of RF transceivers through IQ data analysis. in Proceedings - International Test Conference., 4437641, 2007 IEEE International Test Conference, ITC, Santa Clara, CA, United States, 10/23/07. https://doi.org/10.1109/TEST.2007.4437641
Acar, Erkan ; Ozev, Sule. / Low cost characterization of RF transceivers through IQ data analysis. Proceedings - International Test Conference. 2008.
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