TY - GEN
T1 - Low cost characterization of RF transceivers through IQ data analysis
AU - Acar, Erkan
AU - Ozev, Sule
PY - 2007
Y1 - 2007
N2 - As Radio Frequency (RF) devices become more complex and the integration levels increase, their testing becomes more challenging. In order to guarantee successful operation and compliance to certain specifications, measurement of a large number performance parameters under the prescribed operation conditions is needed. Such detailed characterization typically necessitates long test times and expensive instrumentation, increasing the test cost. In this paper, we present a low cost test methodology that determines the RF device's vital performance parameters, such as path gain, IIP3, quadrature imbalances, noise, bit error rate (BER), and error vector magnitude (EVM) through a single test setup. The proposed test methodology is applicable for both single carrier systems and multi-carrier systems. Simulation and measurement results indicate that these performance parameters can be calculated and estimated accurately through a single test set-up and using a shorter test sequence than required by traditional techniques.
AB - As Radio Frequency (RF) devices become more complex and the integration levels increase, their testing becomes more challenging. In order to guarantee successful operation and compliance to certain specifications, measurement of a large number performance parameters under the prescribed operation conditions is needed. Such detailed characterization typically necessitates long test times and expensive instrumentation, increasing the test cost. In this paper, we present a low cost test methodology that determines the RF device's vital performance parameters, such as path gain, IIP3, quadrature imbalances, noise, bit error rate (BER), and error vector magnitude (EVM) through a single test setup. The proposed test methodology is applicable for both single carrier systems and multi-carrier systems. Simulation and measurement results indicate that these performance parameters can be calculated and estimated accurately through a single test set-up and using a shorter test sequence than required by traditional techniques.
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U2 - 10.1109/TEST.2007.4437641
DO - 10.1109/TEST.2007.4437641
M3 - Conference contribution
AN - SCOPUS:39749105407
SN - 1424411289
SN - 9781424411283
T3 - Proceedings - International Test Conference
BT - 2007 IEEE International Test Conference, ITC
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2007 IEEE International Test Conference, ITC
Y2 - 23 October 2007 through 25 October 2007
ER -