Loss in coupling due to crack in piezoelectric wafer based sensors and actuators

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Two different types of hysteresis are considered for loss mechanism of piezoelectric materials: one addressing the energy required to align the dipole orientation with the direction of electric field through 180° and 90° domain switching, and the other addressing the energy required to overcome the cracks in piezoelectric materials. By modeling piezoelectric materials as tetragonal crystallites with dipole moments, evolution of polarization due to applied electric filed is derived. Furthermore, dielectric, mechanical, and electromechanical losses due to the inclusions of cracks in piezoelectric solids are investigated. The influence of the existence of a crack is described through the characterization of the perturbation to stress and strain distribution. The strain energy release rates are used to determine the energy dissipation due to the crack. Correspondence principle is then applied to determine loss factors such that the constitutive laws governing the energy loss in dielectric, mechanical, and piezoelectric domains can be quantified. Therefore, the complex electromechanical coupling relations can be expressed by using a phase lag, which indicates the property degradation of piezoelectric materials.

Original languageEnglish (US)
Title of host publicationCollection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference
Pages4619-4630
Number of pages12
Volume7
StatePublished - 2006
Event47th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference - Newport, RI, United States
Duration: May 1 2006May 4 2006

Other

Other47th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference
CountryUnited States
CityNewport, RI
Period5/1/065/4/06

Fingerprint

Piezoelectric materials
Actuators
Cracks
Sensors
Energy dissipation
Electromechanical coupling
Energy release rate
Dipole moment
Strain energy
Crystallites
Hysteresis
Electric fields
Polarization
Degradation

ASJC Scopus subject areas

  • Architecture

Cite this

Zhou, X., & Chattopadhyay, A. (2006). Loss in coupling due to crack in piezoelectric wafer based sensors and actuators. In Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference (Vol. 7, pp. 4619-4630)

Loss in coupling due to crack in piezoelectric wafer based sensors and actuators. / Zhou, Xu; Chattopadhyay, Aditi.

Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference. Vol. 7 2006. p. 4619-4630.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhou, X & Chattopadhyay, A 2006, Loss in coupling due to crack in piezoelectric wafer based sensors and actuators. in Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference. vol. 7, pp. 4619-4630, 47th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference, Newport, RI, United States, 5/1/06.
Zhou X, Chattopadhyay A. Loss in coupling due to crack in piezoelectric wafer based sensors and actuators. In Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference. Vol. 7. 2006. p. 4619-4630
Zhou, Xu ; Chattopadhyay, Aditi. / Loss in coupling due to crack in piezoelectric wafer based sensors and actuators. Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference. Vol. 7 2006. pp. 4619-4630
@inproceedings{b8aa3be52a734600942933e407df5a1f,
title = "Loss in coupling due to crack in piezoelectric wafer based sensors and actuators",
abstract = "Two different types of hysteresis are considered for loss mechanism of piezoelectric materials: one addressing the energy required to align the dipole orientation with the direction of electric field through 180° and 90° domain switching, and the other addressing the energy required to overcome the cracks in piezoelectric materials. By modeling piezoelectric materials as tetragonal crystallites with dipole moments, evolution of polarization due to applied electric filed is derived. Furthermore, dielectric, mechanical, and electromechanical losses due to the inclusions of cracks in piezoelectric solids are investigated. The influence of the existence of a crack is described through the characterization of the perturbation to stress and strain distribution. The strain energy release rates are used to determine the energy dissipation due to the crack. Correspondence principle is then applied to determine loss factors such that the constitutive laws governing the energy loss in dielectric, mechanical, and piezoelectric domains can be quantified. Therefore, the complex electromechanical coupling relations can be expressed by using a phase lag, which indicates the property degradation of piezoelectric materials.",
author = "Xu Zhou and Aditi Chattopadhyay",
year = "2006",
language = "English (US)",
isbn = "1563478080",
volume = "7",
pages = "4619--4630",
booktitle = "Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference",

}

TY - GEN

T1 - Loss in coupling due to crack in piezoelectric wafer based sensors and actuators

AU - Zhou, Xu

AU - Chattopadhyay, Aditi

PY - 2006

Y1 - 2006

N2 - Two different types of hysteresis are considered for loss mechanism of piezoelectric materials: one addressing the energy required to align the dipole orientation with the direction of electric field through 180° and 90° domain switching, and the other addressing the energy required to overcome the cracks in piezoelectric materials. By modeling piezoelectric materials as tetragonal crystallites with dipole moments, evolution of polarization due to applied electric filed is derived. Furthermore, dielectric, mechanical, and electromechanical losses due to the inclusions of cracks in piezoelectric solids are investigated. The influence of the existence of a crack is described through the characterization of the perturbation to stress and strain distribution. The strain energy release rates are used to determine the energy dissipation due to the crack. Correspondence principle is then applied to determine loss factors such that the constitutive laws governing the energy loss in dielectric, mechanical, and piezoelectric domains can be quantified. Therefore, the complex electromechanical coupling relations can be expressed by using a phase lag, which indicates the property degradation of piezoelectric materials.

AB - Two different types of hysteresis are considered for loss mechanism of piezoelectric materials: one addressing the energy required to align the dipole orientation with the direction of electric field through 180° and 90° domain switching, and the other addressing the energy required to overcome the cracks in piezoelectric materials. By modeling piezoelectric materials as tetragonal crystallites with dipole moments, evolution of polarization due to applied electric filed is derived. Furthermore, dielectric, mechanical, and electromechanical losses due to the inclusions of cracks in piezoelectric solids are investigated. The influence of the existence of a crack is described through the characterization of the perturbation to stress and strain distribution. The strain energy release rates are used to determine the energy dissipation due to the crack. Correspondence principle is then applied to determine loss factors such that the constitutive laws governing the energy loss in dielectric, mechanical, and piezoelectric domains can be quantified. Therefore, the complex electromechanical coupling relations can be expressed by using a phase lag, which indicates the property degradation of piezoelectric materials.

UR - http://www.scopus.com/inward/record.url?scp=34147197051&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=34147197051&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:34147197051

SN - 1563478080

SN - 9781563478086

VL - 7

SP - 4619

EP - 4630

BT - Collection of Technical Papers - AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference

ER -