Long-lived optical phonons in ZnO studied with impulsive stimulated Raman scattering

C. Aku-Leh, J. Zhao, R. Merlin, Jose Menendez, M. Cardona

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The anharmonic properties of the low-frequency E2 phonon in ZnO were measured using impulsive stimulated Raman scattering. At 5 K, the frequency and lifetime are (2.9789±0.0002) THz and (211±7) ps. The unusually long lifetime and the high accuracy in the determination of the frequency hold promise for applications in metrology, quantum computation and materials characterization. The temperature dependence of the lifetime is determined by two-phonon upconversion decay contributions, which vanish at zero temperature. Results suggest that the lifetime is limited by isotopic disorder and that values in the nanosecond range may be achievable in isotopically pure samples.

Original languageEnglish (US)
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number20
StatePublished - Dec 1 2005


ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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