Localization of shunts across the floating junction of DSBC solar cells by lock-in thermography

O. Breitenstein, M. Langenkamp, K. R. McIntosh, Christiana Honsberg, M. Rinio

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

The passivation that is provided by a floating junction (FJ) is degraded by any shunts that occur across the FJ. In Double-Sided Buried-Contact (DSBC) solar cells, shunts have been suspected to occur at various locations of the FJ: at pinholes in the insulating oxide, tunnel currents near the rear fingers, and at the cell edges. However, until recently there has not been a simple technique to precisely localize these shunts, since by definition, the FJ cannot be contacted. Infrared lock-in thermography, performed in the dark by applying a pulsed forward bias to the emitter, can localize FJ shunts with a spacial resolution down to 5 urn. The FJs are "remotely" forward biased via the emitter potential, and the heat dissipation at the shunts is imaged. This technique permits the investigation of any type of leakage phenomena in any type of solar cell within minutes of measuring time by a non-contacting measurement, including the bias dependent leakage current at the edge of the cells.

Original languageEnglish (US)
Title of host publicationConference Record of the IEEE Photovoltaic Specialists Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages124-127
Number of pages4
Volume2000-January
ISBN (Print)0780357728
DOIs
StatePublished - 2000
Externally publishedYes
Event28th IEEE Photovoltaic Specialists Conference, PVSC 2000 - Anchorage, United States
Duration: Sep 15 2000Sep 22 2000

Other

Other28th IEEE Photovoltaic Specialists Conference, PVSC 2000
CountryUnited States
CityAnchorage
Period9/15/009/22/00

Fingerprint

Solar cells
Heat losses
Passivation
Leakage currents
Tunnels
Infrared radiation
Oxides

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Cite this

Breitenstein, O., Langenkamp, M., McIntosh, K. R., Honsberg, C., & Rinio, M. (2000). Localization of shunts across the floating junction of DSBC solar cells by lock-in thermography. In Conference Record of the IEEE Photovoltaic Specialists Conference (Vol. 2000-January, pp. 124-127). [915770] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2000.915770

Localization of shunts across the floating junction of DSBC solar cells by lock-in thermography. / Breitenstein, O.; Langenkamp, M.; McIntosh, K. R.; Honsberg, Christiana; Rinio, M.

Conference Record of the IEEE Photovoltaic Specialists Conference. Vol. 2000-January Institute of Electrical and Electronics Engineers Inc., 2000. p. 124-127 915770.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Breitenstein, O, Langenkamp, M, McIntosh, KR, Honsberg, C & Rinio, M 2000, Localization of shunts across the floating junction of DSBC solar cells by lock-in thermography. in Conference Record of the IEEE Photovoltaic Specialists Conference. vol. 2000-January, 915770, Institute of Electrical and Electronics Engineers Inc., pp. 124-127, 28th IEEE Photovoltaic Specialists Conference, PVSC 2000, Anchorage, United States, 9/15/00. https://doi.org/10.1109/PVSC.2000.915770
Breitenstein O, Langenkamp M, McIntosh KR, Honsberg C, Rinio M. Localization of shunts across the floating junction of DSBC solar cells by lock-in thermography. In Conference Record of the IEEE Photovoltaic Specialists Conference. Vol. 2000-January. Institute of Electrical and Electronics Engineers Inc. 2000. p. 124-127. 915770 https://doi.org/10.1109/PVSC.2000.915770
Breitenstein, O. ; Langenkamp, M. ; McIntosh, K. R. ; Honsberg, Christiana ; Rinio, M. / Localization of shunts across the floating junction of DSBC solar cells by lock-in thermography. Conference Record of the IEEE Photovoltaic Specialists Conference. Vol. 2000-January Institute of Electrical and Electronics Engineers Inc., 2000. pp. 124-127
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