Local gate effect of mechanically deformed crossed carbon nanotube junction

Quan Qing, Daniel A. Nezich, Jing Kong, Zhongyun Wu, Zhongfan Liu

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

In this work, we have demonstrated that the local deformation at the crossed carbon nanotube (CNT) junctions can introduce significant tunable local gate effect under ambient environment. Atomic force microscope (AFM) manipulation of the local deformation yielded a variation in transconductance that was retained after removing the AFM tip. Application of a large source-drain voltage and pressing the CNT junction above a threshold pressure can respectively erase and recover the transconductance modulation reversibly. The local gate effect is found to be independent of the length of the crossed CNT and attributed to the charges residing at the deformed junctions due to formation of localized states. The number of localized charges is estimated to be in the range of 102 to 103. These results may find potential applications in electromechanical sensors and could have important implications for designing nonvolatile devices based on crossed CNT junctions.

Original languageEnglish (US)
Pages (from-to)4715-4720
Number of pages6
JournalNano Letters
Volume10
Issue number11
DOIs
StatePublished - Nov 10 2010
Externally publishedYes

Keywords

  • Carbon nanotube
  • crossed-junction
  • localized charges
  • transconductance modulation

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

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