Local and nonlocal invariance for system robustness investigations of coherent MIMO radar

Daniel Bliss, Hanguang Yu, R. S. Raghavan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The advantages and limitations of coherent multiple-input multiple-output (MIMO) radar have been discussed widely. In practical systems, nonidealities often impose the dominant limitation to system performance. Consequently, successful high-performance systems typically employ adaptive techniques. Because of the higher potential performance of MIMO systems, they become even more sensitive to the system model if adaptivity is not employed. The quintessential example of the need for adaptivity is by ground-moving-target indictor (GMTI) radars, which employ space-time adaptive processing (STAP). As an initial step toward a more general study of test statistic robustness, we study an approximation to STAP, based on requiring test statistic invariance to clutter localization about an angle-Doppler operating point. We consider the effects of angle and velocity mismatch on clutter mitigation performance. Furthermore, we investigate the implications of MIMO waveform cross-antenna contamination by using invariance.

Original languageEnglish (US)
Title of host publicationIEEE National Radar Conference - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1434-1439
Number of pages6
Volume2015-June
EditionJune
DOIs
StatePublished - Jun 22 2015
Event2015 IEEE International Radar Conference, RadarCon 2015 - Arlington, United States
Duration: May 10 2015May 15 2015

Other

Other2015 IEEE International Radar Conference, RadarCon 2015
CountryUnited States
CityArlington
Period5/10/155/15/15

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ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Bliss, D., Yu, H., & Raghavan, R. S. (2015). Local and nonlocal invariance for system robustness investigations of coherent MIMO radar. In IEEE National Radar Conference - Proceedings (June ed., Vol. 2015-June, pp. 1434-1439). [7131220] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/RADAR.2015.7131220