Abstract

Silicon film with pre-crack was used to study the coupling effect of stress and electrochemical field around the crack tip. The in-situ experiments were established to monitor the crack to realize the stress concentration around the crack and simultaneously prevent the crack initiation. The ex-situ Auger electron spectroscopy experiments shown the remarkably Li redistributed phenomenon around the crack tip. Furthermore, the fully coupled finite element method was used to reveal the fundamental mechanisms of the Li gathering effect and the stress relaxation phenomenon around the crack tip.

Original languageEnglish (US)
Pages (from-to)11-15
Number of pages5
JournalScripta Materialia
Volume167
DOIs
StatePublished - Jul 1 2019

Keywords

  • Crack tip
  • Electrochemistry
  • Lithium-ion batteries
  • Silicon
  • Stress-assisted diffusion

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys

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