Lightweight Error Detection and Correction for Semiconductor Memories

Engineering & Materials Science

• Error detection 100%
• Error correction 95%
• Semiconductor materials 80%
• Data storage equipment 55%
• Radiation hardening 52%
• Radiation effects 17%
• Microprocessor chips 11%
• Heavy ions 9%
• Electromagnetic waves 6%
• Integrated circuits 5%
• Radiation 5%
• Satellites 5%
• Fabrication 4%
• Networks (circuits) 3%
• Testing 3%