A testing procedure, based on light emission, which can predict the stability of GaAs solar cells and identify its defects is being developed. The technique detects shunt defects, the likely cause of failure in solar cells, by examining various parameters of light emission from the solar cell. The first part of the testing method, a quality-assurance procedure, screens the solar cells for potential failure. It can be used on all solar cells that will emit light, and can be implemented online. The entire procedure takes less than 30 s per solar cell. The second part of the testing method identifies defects in the solar cell by examining the light emission from the solar cell in conjunction with standard solar cell parameters. Light emission provides a robust source of data which can be used both for quality assurance and the analysis of defects.
|Original language||English (US)|
|Title of host publication||Conference Record of the IEEE Photovoltaic Specialists Conference|
|Number of pages||6|
|State||Published - 1987|
ASJC Scopus subject areas
- Control and Systems Engineering
- Condensed Matter Physics