Abstract
A new method for testing gallium arsenide solar cells by examining the light emitted when the solar cell is forward biased is presented. Examination of the emitted light reveals the presence and location of several types of defects. The effect of shunt defects on the emitted light is investigated. Other types of solar cell defects are also discussed.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 59-63 |
| Number of pages | 5 |
| Journal | Solar Cells |
| Volume | 38 |
| Issue number | 8 |
| State | Published - Aug 1 1986 |
| Externally published | Yes |
ASJC Scopus subject areas
- Engineering(all)