Leakage power and circuit aging cooptimization by gate replacement techniques

Yu Wang, Xiaoming Chen, Wenping Wang, Yu Cao, Yuan Xie, Huazhong Yang

Research output: Contribution to journalArticle

43 Scopus citations

Abstract

As technology scales, the aging effect caused by negative bias temperature instability (NBTI) has become a major reliability concern. In the mean time, reducing leakage power remains to be one of the key design goals. Because both NBTI-induced circuit degradation and standby leakage power have a strong dependency on the input vectors, input vector control (IVC) technique could be adopted to reduce the leakage power and mitigate NBTI-induced degradation. The IVC technique, however, is ineffective for larger circuits. Consequently, in this paper, we propose two gate replacement algorithms [direct gate replacement (DGR) algorithm and divide and conquer-based gate replacement (DCBGR) algorithm], together with optimal input vector selection, to simultaneously reduce the leakage power and mitigate NBTI-induced degradation. Our experimental results on 23 benchmark circuits reveal the following. 1) Both DGR and DCBGR algorithms outperform pure IVC technique by 15%-30% with 5% delay relaxation for three different design goals: leakage power reduction only, NBTI mitigation only, and leakage/NBTI cooptimization. 2) The DCBGR algorithm leads to better optimization results and save on average more than 10 × runtime compared to the DGR algorithm. 3) The area overhead for leakage reduction is much more than that for NBTI mitigation.

Original languageEnglish (US)
Article number5378474
Pages (from-to)615-628
Number of pages14
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume19
Issue number4
DOIs
StatePublished - Apr 1 2011

Keywords

  • Gate replacement
  • internal node control (INC)
  • leakage power
  • negative bias temperature instability (NBTI)

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Leakage power and circuit aging cooptimization by gate replacement techniques'. Together they form a unique fingerprint.

  • Cite this