Leakage diagnostics in pressure sensing lines for nuclear power plants

Keith Holbert, Kang Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The equivalent pi model is utilized to provide an exact representation of the transfer function of a pressure transmitter instrument line. The construct is expanded to include the pressure sensor as well as the possibility of sensing line leakage. The resonant peak magnitude patterns provide a fingerprint indicating the location of the leak within the sensing line.

Original languageEnglish (US)
Title of host publication7th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies 2010, NPIC and HMIT 2010
Pages906-915
Number of pages10
StatePublished - Dec 1 2010
Event7th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies 2010, NPIC and HMIT 2010 - Las Vegas, NV, United States
Duration: Nov 7 2010Nov 11 2010

Publication series

Name7th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies 2010, NPIC and HMIT 2010
Volume2

Other

Other7th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies 2010, NPIC and HMIT 2010
CountryUnited States
CityLas Vegas, NV
Period11/7/1011/11/10

    Fingerprint

Keywords

  • Hydraulic-electric analogy
  • Noise analysis
  • Power spectral density

ASJC Scopus subject areas

  • Human-Computer Interaction
  • Nuclear Energy and Engineering
  • Control and Systems Engineering

Cite this

Holbert, K., & Lin, K. (2010). Leakage diagnostics in pressure sensing lines for nuclear power plants. In 7th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies 2010, NPIC and HMIT 2010 (pp. 906-915). (7th International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies 2010, NPIC and HMIT 2010; Vol. 2).