Leakage currents in S1-xGex virtual substrates: Measurements and device implications

S. Kanjanachuchai, Trevor Thornton, J. M. Fernández, H. Ahmed

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Leakage currents originating in the Si1-xGex virtual substrates which are required in many Si heterostructure systems have been measured. Both ohmic (AuSb) and Schottky (Pt) contacts to a modulation-doped Si:SiGe heterostructure show significant leakage when the contacts cover deep pits originating from growth defects and contaminants. Shallower pits emerging later in the growth process do not contribute to extra conduction. These pits appear after growth of the graded Si1-xGex layer which leads us to conclude that carrier transport from the contact along the dense network of dislocations formed in the graded buffer layer is responsible for the leakage found in Si:SiGe systems making use of virtual substrates.

Original languageEnglish (US)
Pages (from-to)1215-1218
Number of pages4
JournalSemiconductor Science and Technology
Volume13
Issue number10
DOIs
StatePublished - Oct 1998
Externally publishedYes

Fingerprint

Leakage currents
leakage
Heterojunctions
Substrates
Carrier transport
Buffer layers
contaminants
emerging
buffers
Modulation
Impurities
modulation
conduction
Defects
defects

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Leakage currents in S1-xGex virtual substrates : Measurements and device implications. / Kanjanachuchai, S.; Thornton, Trevor; Fernández, J. M.; Ahmed, H.

In: Semiconductor Science and Technology, Vol. 13, No. 10, 10.1998, p. 1215-1218.

Research output: Contribution to journalArticle

Kanjanachuchai, S. ; Thornton, Trevor ; Fernández, J. M. ; Ahmed, H. / Leakage currents in S1-xGex virtual substrates : Measurements and device implications. In: Semiconductor Science and Technology. 1998 ; Vol. 13, No. 10. pp. 1215-1218.
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