LCLS X-RAY pulse duration measurement using the statistical fluctuation method

J. Wu, Y. Ding, P. Emma, Z. Huang, H. Loos, Marc Messerschmidt, E. Schneidmiller, M. Yurkov

Research output: Contribution to conferencePaper

2 Citations (Scopus)

Abstract

For a Self-Amplified Spontaneous Emission (SASE) Free-Electron Laser (FEL), the FEL pulse energy fluctuates from shot to shot, because the lasing process starts up from shot noise. When operating in the exponential growth regime, the radiation exhibits the properties of completely chaotic polarized light. Hence, the probability distribution of the FEL pulse energy follows a Gamma-distribution. Measuring such a distribution function, one can calculate the average number of "degrees of freedom" or "modes" in the radiation pulse. Measuring the FEL power gain length, one can extract the temporal duration of a single coherent spike, therefore, one can calculate the FEL pulse temporal duration. In this paper, we report experimental results at LCLS. Measurements are conducted for both nominal charge (250 pC) and low charge (40 pC and 20 pC) cases.

Original languageEnglish (US)
Pages147-150
Number of pages4
StatePublished - Dec 1 2010
Externally publishedYes
Event32nd International Free Electron Laser Conference, FEL 2010 - Malmo City, Sweden
Duration: Aug 23 2010Aug 27 2010

Other

Other32nd International Free Electron Laser Conference, FEL 2010
CountrySweden
CityMalmo City
Period8/23/108/27/10

Fingerprint

free electron lasers
pulse duration
pulses
x rays
shot
power gain
shot noise
radiation
spikes
polarized light
spontaneous emission
lasing
degrees of freedom
distribution functions
energy

ASJC Scopus subject areas

  • Nuclear and High Energy Physics

Cite this

Wu, J., Ding, Y., Emma, P., Huang, Z., Loos, H., Messerschmidt, M., ... Yurkov, M. (2010). LCLS X-RAY pulse duration measurement using the statistical fluctuation method. 147-150. Paper presented at 32nd International Free Electron Laser Conference, FEL 2010, Malmo City, Sweden.

LCLS X-RAY pulse duration measurement using the statistical fluctuation method. / Wu, J.; Ding, Y.; Emma, P.; Huang, Z.; Loos, H.; Messerschmidt, Marc; Schneidmiller, E.; Yurkov, M.

2010. 147-150 Paper presented at 32nd International Free Electron Laser Conference, FEL 2010, Malmo City, Sweden.

Research output: Contribution to conferencePaper

Wu, J, Ding, Y, Emma, P, Huang, Z, Loos, H, Messerschmidt, M, Schneidmiller, E & Yurkov, M 2010, 'LCLS X-RAY pulse duration measurement using the statistical fluctuation method', Paper presented at 32nd International Free Electron Laser Conference, FEL 2010, Malmo City, Sweden, 8/23/10 - 8/27/10 pp. 147-150.
Wu J, Ding Y, Emma P, Huang Z, Loos H, Messerschmidt M et al. LCLS X-RAY pulse duration measurement using the statistical fluctuation method. 2010. Paper presented at 32nd International Free Electron Laser Conference, FEL 2010, Malmo City, Sweden.
Wu, J. ; Ding, Y. ; Emma, P. ; Huang, Z. ; Loos, H. ; Messerschmidt, Marc ; Schneidmiller, E. ; Yurkov, M. / LCLS X-RAY pulse duration measurement using the statistical fluctuation method. Paper presented at 32nd International Free Electron Laser Conference, FEL 2010, Malmo City, Sweden.4 p.
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