Laypeople's and experts' perception of nanotechnology hazards

Michael Siegrist, Carmen Keller, Hans Kastenholz, Silvia Frey, Arnim Wiek

Research output: Contribution to journalArticle

204 Citations (Scopus)

Abstract

Public perception of nanotechnology may influence the realization of technological advances. Laypeople's (N = 375) and experts' (N = 46) perception of 20 different nanotechnology applications and three nonnanotechnology applications were examined. The psychometric paradigm was utilized and applications were described in short scenarios. Results showed that laypeople and experts assessed asbestos as much more risky than nanotechnology applications. Analyses of aggregated data suggested that perceived dreadfulness of applications and trust in governmental agencies are important factors in determining perceived risks. Similar results were observed for experts and laypeople, but the latter perceived greater risks than the former. Analyses of individual data showed that trust, perceived benefits, and general attitudes toward technology influenced the perceived risk of laypeople. In the expert sample, confidence in governmental agencies was an important predictor of risks associated with nanotechnology applications. Results suggest that public concerns about nanotechnology would diminish if measures were taken to enhance laypeople's trust in governmental agencies.

Original languageEnglish (US)
Pages (from-to)59-69
Number of pages11
JournalRisk Analysis
Volume27
Issue number1
DOIs
StatePublished - Feb 2007
Externally publishedYes

Fingerprint

layperson
Nanotechnology
nanotechnology
Hazards
expert
Asbestos
Psychometrics
psychometrics
confidence
paradigm
scenario
Technology

Keywords

  • Nanotechnology
  • Psychometric paradigm
  • Risk perception
  • Trust

ASJC Scopus subject areas

  • Social Sciences (miscellaneous)
  • Safety, Risk, Reliability and Quality

Cite this

Laypeople's and experts' perception of nanotechnology hazards. / Siegrist, Michael; Keller, Carmen; Kastenholz, Hans; Frey, Silvia; Wiek, Arnim.

In: Risk Analysis, Vol. 27, No. 1, 02.2007, p. 59-69.

Research output: Contribution to journalArticle

Siegrist, Michael ; Keller, Carmen ; Kastenholz, Hans ; Frey, Silvia ; Wiek, Arnim. / Laypeople's and experts' perception of nanotechnology hazards. In: Risk Analysis. 2007 ; Vol. 27, No. 1. pp. 59-69.
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