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Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Core Digital Structures
T. Wallace, M. Spear, Aymeric Privat, J. Neuendank, G. Irumva, D. Wilson, I. Sanchez Esqueda, H. J. Barnaby, M. Turowski, E. Mikkola, D. Hughart, M. J. Marinella, J. Brunhaver, Amos Gutierrez, R. Von Niederhausern, S. Holloway, D. Beltran, J. L. Taggart
Research output: Contribution to journal › Article › peer-review