Lattice-scale imaging of mica and clay (001) surfaces by atomic force microscopy using net attractive forces

Thomas Sharp, Patrick I. Oden, P R Buseck

Research output: Contribution to journalArticle

35 Citations (Scopus)

Abstract

The force between a sample and the tip during an AFM experiment consists of both attractive and repulsive components. In air, attraction is a combination of capillary adhesion from adsorbed water and attraction from van der Waals and Coulombic interactions. Opposing these attractive components is the repulsive force resulting from overlap of electron orbitais at the point of tip-sample contact. If the tip is very sharp, this Pauli-exclusion force is localized enough to obtain atomic- and lattice-scale resolution. In air, repulsive contact is present even while scanning with a net attractive force, as indicated by atomic- or lattice-scale resolution in the attractive-imaging mode. In this paper, we present lattice-scale images of mica and clay (001) surfaces that were obtained in air with a net attractive force on the cantilever. These images demonstrate that contact forces at the point of tip-sample contact oppose the capillary forces acting on the AFM tip in air.

Original languageEnglish (US)
JournalSurface Science
Volume284
Issue number1-2
DOIs
StatePublished - Mar 10 1993

Fingerprint

Mica
mica
clays
Atomic force microscopy
Clay
atomic force microscopy
Imaging techniques
Air
air
attraction
Contacts (fluid mechanics)
Adhesion
Scanning
clay
Electrons
Water
exclusion
adhesion
Experiments
scanning

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Lattice-scale imaging of mica and clay (001) surfaces by atomic force microscopy using net attractive forces. / Sharp, Thomas; Oden, Patrick I.; Buseck, P R.

In: Surface Science, Vol. 284, No. 1-2, 10.03.1993.

Research output: Contribution to journalArticle

@article{97d1ed735f18411bb2d7aa4149de5c89,
title = "Lattice-scale imaging of mica and clay (001) surfaces by atomic force microscopy using net attractive forces",
abstract = "The force between a sample and the tip during an AFM experiment consists of both attractive and repulsive components. In air, attraction is a combination of capillary adhesion from adsorbed water and attraction from van der Waals and Coulombic interactions. Opposing these attractive components is the repulsive force resulting from overlap of electron orbitais at the point of tip-sample contact. If the tip is very sharp, this Pauli-exclusion force is localized enough to obtain atomic- and lattice-scale resolution. In air, repulsive contact is present even while scanning with a net attractive force, as indicated by atomic- or lattice-scale resolution in the attractive-imaging mode. In this paper, we present lattice-scale images of mica and clay (001) surfaces that were obtained in air with a net attractive force on the cantilever. These images demonstrate that contact forces at the point of tip-sample contact oppose the capillary forces acting on the AFM tip in air.",
author = "Thomas Sharp and Oden, {Patrick I.} and Buseck, {P R}",
year = "1993",
month = "3",
day = "10",
doi = "10.1016/0039-6028(93)90516-M",
language = "English (US)",
volume = "284",
journal = "Surface Science",
issn = "0039-6028",
publisher = "Elsevier",
number = "1-2",

}

TY - JOUR

T1 - Lattice-scale imaging of mica and clay (001) surfaces by atomic force microscopy using net attractive forces

AU - Sharp, Thomas

AU - Oden, Patrick I.

AU - Buseck, P R

PY - 1993/3/10

Y1 - 1993/3/10

N2 - The force between a sample and the tip during an AFM experiment consists of both attractive and repulsive components. In air, attraction is a combination of capillary adhesion from adsorbed water and attraction from van der Waals and Coulombic interactions. Opposing these attractive components is the repulsive force resulting from overlap of electron orbitais at the point of tip-sample contact. If the tip is very sharp, this Pauli-exclusion force is localized enough to obtain atomic- and lattice-scale resolution. In air, repulsive contact is present even while scanning with a net attractive force, as indicated by atomic- or lattice-scale resolution in the attractive-imaging mode. In this paper, we present lattice-scale images of mica and clay (001) surfaces that were obtained in air with a net attractive force on the cantilever. These images demonstrate that contact forces at the point of tip-sample contact oppose the capillary forces acting on the AFM tip in air.

AB - The force between a sample and the tip during an AFM experiment consists of both attractive and repulsive components. In air, attraction is a combination of capillary adhesion from adsorbed water and attraction from van der Waals and Coulombic interactions. Opposing these attractive components is the repulsive force resulting from overlap of electron orbitais at the point of tip-sample contact. If the tip is very sharp, this Pauli-exclusion force is localized enough to obtain atomic- and lattice-scale resolution. In air, repulsive contact is present even while scanning with a net attractive force, as indicated by atomic- or lattice-scale resolution in the attractive-imaging mode. In this paper, we present lattice-scale images of mica and clay (001) surfaces that were obtained in air with a net attractive force on the cantilever. These images demonstrate that contact forces at the point of tip-sample contact oppose the capillary forces acting on the AFM tip in air.

UR - http://www.scopus.com/inward/record.url?scp=0027560096&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027560096&partnerID=8YFLogxK

U2 - 10.1016/0039-6028(93)90516-M

DO - 10.1016/0039-6028(93)90516-M

M3 - Article

VL - 284

JO - Surface Science

JF - Surface Science

SN - 0039-6028

IS - 1-2

ER -