@inproceedings{805aa784f57d406996a709ec74c45b7d,
title = "Latest developments in the x-ray based characterization of thin-film solar cells",
abstract = "We present the latest developments in the characterization of thin-film solar cells based on the combination of elemental mapping from fluorescence measurements using synchrotron x-rays, with beam induced current from electron and x-ray beams. This is a powerful method to directly correlate compositional variations with charge collection efficiency. We compare different approaches for mapping solar cells both in cross-section and in plan view on CIGS and CdTe solar cells. Based on examples from our latest research, we discuss the experimental approaches and highlight the advantages and limitations of each technique. Finally, we present an outlook to experiments that will allow x-ray based characterization to enter new fields of research that were not accessible before.",
keywords = "CIGS, CdTe, EBIC, XBIC, XRF, thin-film solar cells",
author = "Michael Stuckelberger and Bradley West and Sebastian Husein and Harvey Guthrey and Mowafak Al-Jassim and Rupak Chakraborty and Tonio Buonassisi and Maser, {Jorg M.} and Barry Lai and Benjamin Stripe and Volker Rose and Mariana Bertoni",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 ; Conference date: 14-06-2015 Through 19-06-2015",
year = "2015",
month = dec,
day = "14",
doi = "10.1109/PVSC.2015.7355592",
language = "English (US)",
series = "2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015",
}