Latest developments in the x-ray based characterization of thin-film solar cells

Michael Stuckelberger, Bradley West, Sebastian Husein, Harvey Guthrey, Mowafak Al-Jassim, Rupak Chakraborty, Tonio Buonassisi, Jorg M. Maser, Barry Lai, Benjamin Stripe, Volker Rose, Mariana Bertoni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

We present the latest developments in the characterization of thin-film solar cells based on the combination of elemental mapping from fluorescence measurements using synchrotron x-rays, with beam induced current from electron and x-ray beams. This is a powerful method to directly correlate compositional variations with charge collection efficiency. We compare different approaches for mapping solar cells both in cross-section and in plan view on CIGS and CdTe solar cells. Based on examples from our latest research, we discuss the experimental approaches and highlight the advantages and limitations of each technique. Finally, we present an outlook to experiments that will allow x-ray based characterization to enter new fields of research that were not accessible before.

Original languageEnglish (US)
Title of host publication2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479979448
DOIs
StatePublished - Dec 14 2015
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: Jun 14 2015Jun 19 2015

Other

Other42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
CountryUnited States
CityNew Orleans
Period6/14/156/19/15

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Keywords

  • CdTe
  • CIGS
  • EBIC
  • thin-film solar cells
  • XBIC
  • XRF

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Stuckelberger, M., West, B., Husein, S., Guthrey, H., Al-Jassim, M., Chakraborty, R., Buonassisi, T., Maser, J. M., Lai, B., Stripe, B., Rose, V., & Bertoni, M. (2015). Latest developments in the x-ray based characterization of thin-film solar cells. In 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 [7355592] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2015.7355592