A DIA-type cubic-anvil high pressure apparatus (SAM-85) has been interfaced with white x-ray radiation from the superconducting wiggler port of the National Synchrotron Light Source at Brookhaven National Laboratory. Energy-dispersive x-ray diffraction measurements can be obtained for samples with dimensions of the order of 1 mm as a function of pressure and temperature utilizing x-ray energies of up to 100 keV. The sample environment is examined. Pressure is uniform in the sample chamber to within 0.1 GPa, and temperature is constant in the scattering volume to within 5°C. A method is defined for determining deviatoric stress. We find that for a sample containing NaCl and Au, the deviatoric stress increases to about 0.3 GPa as pressure increases to 1.5 GPa and then remains constant, probably reflecting the strength of the sample. Upon heating, the deviatoric stress quickly approaches zero.
- Synchroton instrumentation
- accuracy in energy-dispersive diffraction
- high energy
- high pressure-high temperature
- large volume press
ASJC Scopus subject areas
- Condensed Matter Physics