Large system analysis of blind multiuser detection in CDMA networks

Junshan Zhang, X. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We consider wideband CDMA networks with many users, and study the system performance when blind linear multiuser receivers are employed for demodulation. We first characterize the signal-to-interference-plus-noise ratio (SINR) for blind multiuser receivers. Our results reveal that the SIR of these blind receivers saturates when the power of the desired user increases, which is in stark contrast to the fact that the SIR achieved by the exact MMSE receiver can get arbitrarily large. This saturation phenomenon of SINR indicates that the capacity of a wireless network with blind multiuser receivers is not only interference-limited, but also estimation-error limited. Furthermore, the effect of estimation error can be quantified. We then show that the residual interference at the output of these blind receivers is asymptotically Gaussian. The Gaussianity enables easy characterization of bit error probability. A parallel result is that the estimation error of the receiver is asymptotically orthogonal to the signal space.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsE.K.P. Chong
Pages179-190
Number of pages12
Volume4531
DOIs
StatePublished - 2001
EventModelling and Design of Wireless Networks - Denver, CO, United States
Duration: Aug 21 2001Aug 23 2001

Other

OtherModelling and Design of Wireless Networks
CountryUnited States
CityDenver, CO
Period8/21/018/23/01

Keywords

  • Blind multiuser detection
  • Large system analysis
  • MMSE
  • Subspace

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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  • Cite this

    Zhang, J., & Wang, X. (2001). Large system analysis of blind multiuser detection in CDMA networks. In E. K. P. Chong (Ed.), Proceedings of SPIE - The International Society for Optical Engineering (Vol. 4531, pp. 179-190) https://doi.org/10.1117/12.434451