Large-scale broad-band parasitic extraction for fast layout verification of 3-D RF and mixed-signal on-chip structures

Feng Ling, Vladimir I. Okhmatovski, Warren Harris, Stephen McCracken, Aykut Dengi

Research output: Contribution to journalArticlepeer-review

46 Scopus citations

Fingerprint

Dive into the research topics of 'Large-scale broad-band parasitic extraction for fast layout verification of 3-D RF and mixed-signal on-chip structures'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science