Lamb wave based feature extraction of damage in a stiffened composite panel under varying temperature

Anthony J. Vizzini, Aditi Chattopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper presents a methodology for determining the existence of delaminations in complex composite structures. The changes in damage features due to changing temperature are investigated. A Lamb wave based active damage detection technique is used. The Matching Pursuit Decomposition (MPD), a time frequency based signal processing technique, is used for feature extraction. The signals from two different test structures, a healthy specimen and a specimen with seeded delamination, are compared to incorporate the effect of manufacturing variability. Tests are conducted under varying ambient temperature. The results obtained validate the effectiveness of this approach in detecting delamination.

Original languageEnglish (US)
Title of host publicationHealth Monitoring of Structural and Biological Systems 2012
DOIs
StatePublished - Jun 6 2012
EventHealth Monitoring of Structural and Biological Systems 2012 - San Diego, CA, United States
Duration: Mar 12 2012Mar 15 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8348
ISSN (Print)0277-786X

Other

OtherHealth Monitoring of Structural and Biological Systems 2012
CountryUnited States
CitySan Diego, CA
Period3/12/123/15/12

Keywords

  • Composites
  • Delamination detection
  • Lamb waves
  • Matching pursuit decomposition
  • Temperature variability

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Vizzini, A. J., & Chattopadhyay, A. (2012). Lamb wave based feature extraction of damage in a stiffened composite panel under varying temperature. In Health Monitoring of Structural and Biological Systems 2012 [83481P] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8348). https://doi.org/10.1117/12.915413