Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits

Philippe C. Adell, Ronald L. Pease, Hugh Barnaby, Bernard Rax, Xiao J. Chen, Steven S. McClure

Research output: Contribution to journalArticle

20 Scopus citations

Abstract

High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semiconductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. Radiation hardness assurance implications are discussed.

Original languageEnglish (US)
Article number5341383
Pages (from-to)3326-3333
Number of pages8
JournalIEEE Transactions on Nuclear Science
Volume56
Issue number6
DOIs
StatePublished - Dec 1 2009

Keywords

  • Accelerated testing
  • Dose rate
  • Enhanced low-dose rate sensitivity
  • Hydrogen
  • Interface traps
  • Radiation effects
  • Radiation hardness assurance
  • Total ionizing dose

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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