Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits

Philippe C. Adell; Ronald L. Pease; Hugh Barnaby; Bernard Rax; Xiao J. Chen; Steven S. McClure

doi:10.1109/TNS.2009.2033797

Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits

Philippe C. Adell, Ronald L. Pease, Hugh Barnaby, Bernard Rax, Xiao J. Chen, Steven S. McClure

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semiconductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. Radiation hardness assurance implications are discussed.

Original language	English (US)
Article number	5341383
Pages (from-to)	3326-3333
Number of pages	8
Journal	IEEE Transactions on Nuclear Science
Volume	56
Issue number	6
DOIs	https://doi.org/10.1109/TNS.2009.2033797
State	Published - Dec 2009

Keywords

Accelerated testing
Dose rate
Enhanced low-dose rate sensitivity
Hydrogen
Interface traps
Radiation effects
Radiation hardness assurance
Total ionizing dose

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2009.2033797

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title = "Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits",

abstract = "High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semiconductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. Radiation hardness assurance implications are discussed.",

keywords = "Accelerated testing, Dose rate, Enhanced low-dose rate sensitivity, Hydrogen, Interface traps, Radiation effects, Radiation hardness assurance, Total ionizing dose",

author = "Adell, {Philippe C.} and Pease, {Ronald L.} and Hugh Barnaby and Bernard Rax and Chen, {Xiao J.} and McClure, {Steven S.}",

note = "Funding Information: Manuscript received July 17, 2009; revised September 10, 2009. Current version published December 09, 2009. This work was supported in part by the Defense Threat Reduction Agency Program and the NASA Electronic Parts Program U.S. P. C. Adell, B. Rax, and S. S. McClure are with the Jet Propulsion Laboratory, California Institute of Technology; Pasadena, CA 91109 USA (e-mail: philippe.c.adell@jpl.nasa.gov). R. L. Pease is with RLP Research, Los Lunas, NM 87031 USA (e-mail: lsrlpease@wildblue.net). H. J. Barnaby and X. J. Chen are with Arizona State University, Tempe, AZ 85287 USA (e-mail: hbarnaby@asu.edu). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TNS.2009.2033797",

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AU - Chen, Xiao J.

AU - McClure, Steven S.

N1 - Funding Information: Manuscript received July 17, 2009; revised September 10, 2009. Current version published December 09, 2009. This work was supported in part by the Defense Threat Reduction Agency Program and the NASA Electronic Parts Program U.S. P. C. Adell, B. Rax, and S. S. McClure are with the Jet Propulsion Laboratory, California Institute of Technology; Pasadena, CA 91109 USA (e-mail: philippe.c.adell@jpl.nasa.gov). R. L. Pease is with RLP Research, Los Lunas, NM 87031 USA (e-mail: lsrlpease@wildblue.net). H. J. Barnaby and X. J. Chen are with Arizona State University, Tempe, AZ 85287 USA (e-mail: hbarnaby@asu.edu). Color versions of one or more of the figures in this paper are available online at http://ieeexplore.ieee.org. Digital Object Identifier 10.1109/TNS.2009.2033797

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N2 - High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semiconductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. Radiation hardness assurance implications are discussed.

AB - High dose rate irradiation with hydrogen stress is proposed as an accelerated total dose test method for bipolar linear circuits. The method is validated across process and circuit technologies with five parts that are commonly used in space: a comparator (LM193 from National Semiconductor), a voltage regulator (HSYE-117 RH from Intersil), a voltage reference (LT1019 from Linear Technology), a JFET input op amp (OP42 from Analog Devices) and a temperature transducer (AD590 from Analog Devices). The testing technique could rapidly establish an upper bound to the low dose rate response of parts in space and help with the part selection process in the design phase of a mission. Radiation hardness assurance implications are discussed.

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Irradiation with molecular hydrogen as an accelerated total dose hardness assurance test method for bipolar linear circuits

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