I/Q-channel mismatch transfer and amplification effects and applications to the measurement and calibration of integrated VLIF RF receivers

Hongjiang Song, Syed Roomi Naqvi, Bertan Bakkaloglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Design of integrated very low intermediate frequency (VLIF) RF receivers with better than 35dB image rejection (IR) usually requires detection and calibration of I/Q channel mismatches less than 0.1dB in amplitude and 1.8 degree in phase. A mismatch amplification technique for improving detection sensitivity is presented in this paper. The proposed mismatch transfer function technique provides an effective method to calculate internal amplitude and phase mismatches from the measured EVM at the receiver output. Experimental data from an integrated VLIF receiver test chip is used to demonstrate the theory. By utilizing this technique, an I/Q mismatch measurement resolution as low as 0.01 dB in amplitude and 0.18 degree in phase is achieved.

Original languageEnglish (US)
Title of host publication2006 IEEE International Systems-on-Chip Conference, SOC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages35-38
Number of pages4
ISBN (Print)0780397819, 9780780397811
DOIs
StatePublished - Jan 1 2006
Event2006 IEEE International Systems-on-Chip Conference, SOC - Austin, TX, United States
Duration: Sep 24 2006Sep 27 2006

Publication series

Name2006 IEEE International Systems-on-Chip Conference, SOC

Other

Other2006 IEEE International Systems-on-Chip Conference, SOC
CountryUnited States
CityAustin, TX
Period9/24/069/27/06

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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    Song, H., Naqvi, S. R., & Bakkaloglu, B. (2006). I/Q-channel mismatch transfer and amplification effects and applications to the measurement and calibration of integrated VLIF RF receivers. In 2006 IEEE International Systems-on-Chip Conference, SOC (pp. 35-38). [4063007] (2006 IEEE International Systems-on-Chip Conference, SOC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SOCC.2006.283838