Ion milled tips for scanning tunneling microscopy

D. K. Biegelsen, Fernando Ponce, J. C. Tramontana, S. M. Koch

Research output: Contribution to journalArticle

78 Citations (Scopus)

Abstract

Ion milling of electrochemically etched tungsten tips is shown to improve the characteristics for scanning tunneling microscopy. The primary mechanism for the enhancement of tip reliability is identified to be the removal of a residual oxide. A greatly decreased radius of curvature is also achieved without significantly changing the macrostructural geometry of the tip.

Original languageEnglish (US)
Pages (from-to)696-698
Number of pages3
JournalApplied Physics Letters
Volume50
Issue number11
DOIs
StatePublished - 1987
Externally publishedYes

Fingerprint

scanning tunneling microscopy
ions
tungsten
curvature
radii
oxides
augmentation
geometry

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Biegelsen, D. K., Ponce, F., Tramontana, J. C., & Koch, S. M. (1987). Ion milled tips for scanning tunneling microscopy. Applied Physics Letters, 50(11), 696-698. https://doi.org/10.1063/1.98070

Ion milled tips for scanning tunneling microscopy. / Biegelsen, D. K.; Ponce, Fernando; Tramontana, J. C.; Koch, S. M.

In: Applied Physics Letters, Vol. 50, No. 11, 1987, p. 696-698.

Research output: Contribution to journalArticle

Biegelsen, DK, Ponce, F, Tramontana, JC & Koch, SM 1987, 'Ion milled tips for scanning tunneling microscopy', Applied Physics Letters, vol. 50, no. 11, pp. 696-698. https://doi.org/10.1063/1.98070
Biegelsen, D. K. ; Ponce, Fernando ; Tramontana, J. C. ; Koch, S. M. / Ion milled tips for scanning tunneling microscopy. In: Applied Physics Letters. 1987 ; Vol. 50, No. 11. pp. 696-698.
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