Ion milled tips for scanning tunneling microscopy

D. K. Biegelsen; F. A. Ponce; J. C. Tramontana; S. M. Koch

doi:10.1063/1.98070

Ion milled tips for scanning tunneling microscopy

D. K. Biegelsen, F. A. Ponce, J. C. Tramontana, S. M. Koch

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83 Scopus citations

Abstract

Ion milling of electrochemically etched tungsten tips is shown to improve the characteristics for scanning tunneling microscopy. The primary mechanism for the enhancement of tip reliability is identified to be the removal of a residual oxide. A greatly decreased radius of curvature is also achieved without significantly changing the macrostructural geometry of the tip.

Original language	English (US)
Pages (from-to)	696-698
Number of pages	3
Journal	Applied Physics Letters
Volume	50
Issue number	11
DOIs	https://doi.org/10.1063/1.98070
State	Published - 1987
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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@article{89559d70b35645fe8ac2fbd5b3fbfa5d,

title = "Ion milled tips for scanning tunneling microscopy",

abstract = "Ion milling of electrochemically etched tungsten tips is shown to improve the characteristics for scanning tunneling microscopy. The primary mechanism for the enhancement of tip reliability is identified to be the removal of a residual oxide. A greatly decreased radius of curvature is also achieved without significantly changing the macrostructural geometry of the tip.",

author = "Biegelsen, {D. K.} and Ponce, {F. A.} and Tramontana, {J. C.} and Koch, {S. M.}",

year = "1987",

doi = "10.1063/1.98070",

language = "English (US)",

volume = "50",

pages = "696--698",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "11",

}

TY - JOUR

T1 - Ion milled tips for scanning tunneling microscopy

AU - Biegelsen, D. K.

AU - Ponce, F. A.

AU - Tramontana, J. C.

AU - Koch, S. M.

PY - 1987

Y1 - 1987

N2 - Ion milling of electrochemically etched tungsten tips is shown to improve the characteristics for scanning tunneling microscopy. The primary mechanism for the enhancement of tip reliability is identified to be the removal of a residual oxide. A greatly decreased radius of curvature is also achieved without significantly changing the macrostructural geometry of the tip.

AB - Ion milling of electrochemically etched tungsten tips is shown to improve the characteristics for scanning tunneling microscopy. The primary mechanism for the enhancement of tip reliability is identified to be the removal of a residual oxide. A greatly decreased radius of curvature is also achieved without significantly changing the macrostructural geometry of the tip.

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U2 - 10.1063/1.98070

DO - 10.1063/1.98070

M3 - Article

AN - SCOPUS:0040268165

SN - 0003-6951

VL - 50

SP - 696

EP - 698

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 11

ER -

Ion milled tips for scanning tunneling microscopy

Abstract

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