Ion microscopy using electron-desorbed ions

Peter Williams, David A. Reed, Alan E. Morgan

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

Electron-stimulated desorption can be used as a (quasi-)non-destructive imaging technique in the ion microscope. This allows precise sample location for subsequent sputtering analysis and also may offer a new approach to chemical imaging of surfaces.

Original languageEnglish (US)
Pages (from-to)345-350
Number of pages6
JournalApplications of Surface Science
Volume16
Issue number3-4
DOIs
StatePublished - Jan 1 1983
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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