Ion microscopy using electron-desorbed ions

Peter Williams, David A. Reed, Alan E. Morgan

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Electron-stimulated desorption can be used as a (quasi-)non-destructive imaging technique in the ion microscope. This allows precise sample location for subsequent sputtering analysis and also may offer a new approach to chemical imaging of surfaces.

Original languageEnglish (US)
Pages (from-to)345-350
Number of pages6
JournalApplications of Surface Science
Volume16
Issue number3-4
DOIs
StatePublished - 1983
Externally publishedYes

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Electron microscopy
Ion microscopes
Ions
Imaging techniques
Sputtering
Desorption
Electrons

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Ion microscopy using electron-desorbed ions. / Williams, Peter; Reed, David A.; Morgan, Alan E.

In: Applications of Surface Science, Vol. 16, No. 3-4, 1983, p. 345-350.

Research output: Contribution to journalArticle

Williams, Peter ; Reed, David A. ; Morgan, Alan E. / Ion microscopy using electron-desorbed ions. In: Applications of Surface Science. 1983 ; Vol. 16, No. 3-4. pp. 345-350.
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