Ion microscopy using electron-desorbed ions

Peter Williams; David A. Reed; Alan E. Morgan

doi:10.1016/0378-5963(83)90078-8

Ion microscopy using electron-desorbed ions

Peter Williams, David A. Reed, Alan E. Morgan

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

Electron-stimulated desorption can be used as a (quasi-)non-destructive imaging technique in the ion microscope. This allows precise sample location for subsequent sputtering analysis and also may offer a new approach to chemical imaging of surfaces.

Original language	English (US)
Pages (from-to)	345-350
Number of pages	6
Journal	Applications of Surface Science
Volume	16
Issue number	3-4
DOIs	https://doi.org/10.1016/0378-5963(83)90078-8
State	Published - 1983
Externally published	Yes

ASJC Scopus subject areas

General Engineering

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10.1016/0378-5963(83)90078-8

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@article{d14af55b4ffe48bc80d65762bf3a07a5,

title = "Ion microscopy using electron-desorbed ions",

abstract = "Electron-stimulated desorption can be used as a (quasi-)non-destructive imaging technique in the ion microscope. This allows precise sample location for subsequent sputtering analysis and also may offer a new approach to chemical imaging of surfaces.",

author = "Peter Williams and Reed, {David A.} and Morgan, {Alan E.}",

note = "Funding Information: This work was supported by the National Science Foundation MRL Grant DMR 77-23999 and by the Office of Naval Research (L.R. Cooper).",

year = "1983",

doi = "10.1016/0378-5963(83)90078-8",

language = "English (US)",

volume = "16",

pages = "345--350",

journal = "Applications of Surface Science",

issn = "0378-5963",

publisher = "Elsevier",

number = "3-4",

}

TY - JOUR

T1 - Ion microscopy using electron-desorbed ions

AU - Williams, Peter

AU - Reed, David A.

AU - Morgan, Alan E.

N1 - Funding Information: This work was supported by the National Science Foundation MRL Grant DMR 77-23999 and by the Office of Naval Research (L.R. Cooper).

PY - 1983

Y1 - 1983

N2 - Electron-stimulated desorption can be used as a (quasi-)non-destructive imaging technique in the ion microscope. This allows precise sample location for subsequent sputtering analysis and also may offer a new approach to chemical imaging of surfaces.

AB - Electron-stimulated desorption can be used as a (quasi-)non-destructive imaging technique in the ion microscope. This allows precise sample location for subsequent sputtering analysis and also may offer a new approach to chemical imaging of surfaces.

UR - http://www.scopus.com/inward/record.url?scp=0020786999&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0020786999&partnerID=8YFLogxK

U2 - 10.1016/0378-5963(83)90078-8

DO - 10.1016/0378-5963(83)90078-8

M3 - Article

AN - SCOPUS:0020786999

SN - 0378-5963

VL - 16

SP - 345

EP - 350

JO - Applications of Surface Science

JF - Applications of Surface Science

IS - 3-4

ER -

Ion microscopy using electron-desorbed ions

Abstract

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