Ion beam analysis of VLS grown Ge nanostructures on Si

J. L. Taraci, T. Clement, J. W. Dailey, Jeffery Drucker, S. T. Picraux

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Fingerprint

Dive into the research topics of 'Ion beam analysis of VLS grown Ge nanostructures on Si'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy