(INVITED) analysis and modeling of noise folding and spurious emission in wideband fractional-N synthesizers

Waleed Khalil, Hiva Hedayati, Bertan Bakkaloglu, Sayfe Kiaei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 5 Citations

Abstract

Fraetional-N synthesizers are subject to generation of undesired spurious energy due to both linear and nonlinear processes. Previously, we presented an accurate modeling of the nonlinear, time-varying nature of the phase frequency detector (PFD), charge pump and frequency divider [1]. The proposed modeling technique was able to predict in-band spur power levels within 1.8 dB accuracy. In this paper we demonstrate using the proposed model that the close-in phase noise increase due intermodulation of the ΣΔ high frequency quantization noise is independent of the synthesizer reference frequency, which is in contrast to commonly used linear models. A behavioral model is also used to show that the more detrimental near-integer in-band spurs can be generated by cross-coupling between the synthesizers's various building blocks.

LanguageEnglish (US)
Title of host publicationDigest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
Pages291-294
Number of pages4
DOIs
StatePublished - 2008
Event2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008 - Atlanta, GA, United States
Duration: Jun 15 2008Jun 17 2008

Other

Other2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008
CountryUnited States
CityAtlanta, GA
Period6/15/086/17/08

Fingerprint

Intermodulation
Phase noise
Pumps
Detectors

Keywords

  • Fractional-N frequency synthesizers
  • Phase noise
  • Quantization noise
  • Sigma-delta modulation
  • Spurious emissions

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Khalil, W., Hedayati, H., Bakkaloglu, B., & Kiaei, S. (2008). (INVITED) analysis and modeling of noise folding and spurious emission in wideband fractional-N synthesizers. In Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium (pp. 291-294). [4561438] DOI: 10.1109/RFIC.2008.4561438

(INVITED) analysis and modeling of noise folding and spurious emission in wideband fractional-N synthesizers. / Khalil, Waleed; Hedayati, Hiva; Bakkaloglu, Bertan; Kiaei, Sayfe.

Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2008. p. 291-294 4561438.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Khalil, W, Hedayati, H, Bakkaloglu, B & Kiaei, S 2008, (INVITED) analysis and modeling of noise folding and spurious emission in wideband fractional-N synthesizers. in Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium., 4561438, pp. 291-294, 2008 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2008, Atlanta, GA, United States, 6/15/08. DOI: 10.1109/RFIC.2008.4561438
Khalil W, Hedayati H, Bakkaloglu B, Kiaei S. (INVITED) analysis and modeling of noise folding and spurious emission in wideband fractional-N synthesizers. In Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2008. p. 291-294. 4561438. Available from, DOI: 10.1109/RFIC.2008.4561438
Khalil, Waleed ; Hedayati, Hiva ; Bakkaloglu, Bertan ; Kiaei, Sayfe. / (INVITED) analysis and modeling of noise folding and spurious emission in wideband fractional-N synthesizers. Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium. 2008. pp. 291-294
@inproceedings{f62ff45a29c44aeea999d0a3668019e6,
title = "(INVITED) analysis and modeling of noise folding and spurious emission in wideband fractional-N synthesizers",
abstract = "Fraetional-N synthesizers are subject to generation of undesired spurious energy due to both linear and nonlinear processes. Previously, we presented an accurate modeling of the nonlinear, time-varying nature of the phase frequency detector (PFD), charge pump and frequency divider [1]. The proposed modeling technique was able to predict in-band spur power levels within 1.8 dB accuracy. In this paper we demonstrate using the proposed model that the close-in phase noise increase due intermodulation of the ΣΔ high frequency quantization noise is independent of the synthesizer reference frequency, which is in contrast to commonly used linear models. A behavioral model is also used to show that the more detrimental near-integer in-band spurs can be generated by cross-coupling between the synthesizers's various building blocks.",
keywords = "Fractional-N frequency synthesizers, Phase noise, Quantization noise, Sigma-delta modulation, Spurious emissions",
author = "Waleed Khalil and Hiva Hedayati and Bertan Bakkaloglu and Sayfe Kiaei",
year = "2008",
doi = "10.1109/RFIC.2008.4561438",
language = "English (US)",
isbn = "9781424418091",
pages = "291--294",
booktitle = "Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium",

}

TY - GEN

T1 - (INVITED) analysis and modeling of noise folding and spurious emission in wideband fractional-N synthesizers

AU - Khalil,Waleed

AU - Hedayati,Hiva

AU - Bakkaloglu,Bertan

AU - Kiaei,Sayfe

PY - 2008

Y1 - 2008

N2 - Fraetional-N synthesizers are subject to generation of undesired spurious energy due to both linear and nonlinear processes. Previously, we presented an accurate modeling of the nonlinear, time-varying nature of the phase frequency detector (PFD), charge pump and frequency divider [1]. The proposed modeling technique was able to predict in-band spur power levels within 1.8 dB accuracy. In this paper we demonstrate using the proposed model that the close-in phase noise increase due intermodulation of the ΣΔ high frequency quantization noise is independent of the synthesizer reference frequency, which is in contrast to commonly used linear models. A behavioral model is also used to show that the more detrimental near-integer in-band spurs can be generated by cross-coupling between the synthesizers's various building blocks.

AB - Fraetional-N synthesizers are subject to generation of undesired spurious energy due to both linear and nonlinear processes. Previously, we presented an accurate modeling of the nonlinear, time-varying nature of the phase frequency detector (PFD), charge pump and frequency divider [1]. The proposed modeling technique was able to predict in-band spur power levels within 1.8 dB accuracy. In this paper we demonstrate using the proposed model that the close-in phase noise increase due intermodulation of the ΣΔ high frequency quantization noise is independent of the synthesizer reference frequency, which is in contrast to commonly used linear models. A behavioral model is also used to show that the more detrimental near-integer in-band spurs can be generated by cross-coupling between the synthesizers's various building blocks.

KW - Fractional-N frequency synthesizers

KW - Phase noise

KW - Quantization noise

KW - Sigma-delta modulation

KW - Spurious emissions

UR - http://www.scopus.com/inward/record.url?scp=51849138425&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=51849138425&partnerID=8YFLogxK

U2 - 10.1109/RFIC.2008.4561438

DO - 10.1109/RFIC.2008.4561438

M3 - Conference contribution

SN - 9781424418091

SP - 291

EP - 294

BT - Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium

ER -