Abstract
A number of amorphous and partially crystalline palladium‐silicon alloys have been examined by high resolution transmission electron microscopy at 500 kV. With the directly interpretable resolution extending beyond the first peak in the structure factor at 0ṁ23 nm, details of the local microstructure at the atomic level are visible. Images of small metallic particles show a well‐defined pattern of fringes over local regions. In some instances, especially in partially‐ordered alloys, neighbouring or overlapping fringe patterns appear to be orientationally‐related in a similar manner to fringe systems seen in symmetrically multiply‐twinned particles. The significance of this type of structural examination for amorphous metals is discussed. 1980 Blackwell Science Ltd
Original language | English (US) |
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Pages (from-to) | 63-72 |
Number of pages | 10 |
Journal | Journal of Microscopy |
Volume | 119 |
Issue number | 1 |
DOIs | |
State | Published - 1980 |
Externally published | Yes |
ASJC Scopus subject areas
- Pathology and Forensic Medicine
- Histology