Engineering & Materials Science
Ohmic contacts
100%
Secondary ion mass spectrometry
99%
Alloying
76%
Structural properties
71%
Electric properties
70%
High resolution transmission electron microscopy
54%
Microstructure
44%
Contact resistance
38%
Transmission electron microscopy
33%
Semiconductor materials
29%
Physics & Astronomy
secondary ion mass spectrometry
68%
alloying
58%
electric contacts
58%
electrical properties
48%
transmission electron microscopy
43%
microstructure
38%
contact resistance
34%
high resolution
20%
Chemical Compounds
Secondary Ion Mass Spectroscopy
71%
Alloying
67%
Electrical Property
55%
Microstructure
44%
Contact Resistance
41%
Polycrystalline Solid
29%
Semiconductor
25%
Transmission Electron Microscopy
21%
Time
11%