Investigation of STM image artifacts by in-situ reflection electron microscopy

W. K. Lo, John Spence

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

Scanning tunneling microscope (STM) image artifacts have been studied using an STM operating inside a transmission electron microscope (TEM). This instrument allows independent imaging of the same region by STM and reflection electron microscopy (REM). Modifications made recently have increased its rigidity. STM atomic resolution imaging of graphite inside the TEM demonstrate its stability. Comparison of STM and REM images of nanometer-scale features have revealed image artifacts caused by the STM tip. In particular, instances where features were broadened by tip convolution have been directly identified. Broadening of objects by up to three times is a common occurrence. We have also found instances where features were compressed by the STM tip while imaging. This results in inaccurate STM height information about the feature. This leads to questions about the accuracy of STM images of nanometer-scale features.

Original languageEnglish (US)
Pages (from-to)433-444
Number of pages12
JournalUltramicroscopy
Volume48
Issue number4
DOIs
StatePublished - 1993

Fingerprint

Electron microscopy
artifacts
electron microscopy
Microscopes
microscopes
Scanning
scanning
Imaging techniques
Electron microscopes
electron microscopes
Graphite
Convolution
convolution integrals
rigidity
Rigidity
graphite
occurrences

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation

Cite this

Investigation of STM image artifacts by in-situ reflection electron microscopy. / Lo, W. K.; Spence, John.

In: Ultramicroscopy, Vol. 48, No. 4, 1993, p. 433-444.

Research output: Contribution to journalArticle

@article{cd0da6b09dfd40d6880eb5160b62b001,
title = "Investigation of STM image artifacts by in-situ reflection electron microscopy",
abstract = "Scanning tunneling microscope (STM) image artifacts have been studied using an STM operating inside a transmission electron microscope (TEM). This instrument allows independent imaging of the same region by STM and reflection electron microscopy (REM). Modifications made recently have increased its rigidity. STM atomic resolution imaging of graphite inside the TEM demonstrate its stability. Comparison of STM and REM images of nanometer-scale features have revealed image artifacts caused by the STM tip. In particular, instances where features were broadened by tip convolution have been directly identified. Broadening of objects by up to three times is a common occurrence. We have also found instances where features were compressed by the STM tip while imaging. This results in inaccurate STM height information about the feature. This leads to questions about the accuracy of STM images of nanometer-scale features.",
author = "Lo, {W. K.} and John Spence",
year = "1993",
doi = "10.1016/0304-3991(93)90119-I",
language = "English (US)",
volume = "48",
pages = "433--444",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "4",

}

TY - JOUR

T1 - Investigation of STM image artifacts by in-situ reflection electron microscopy

AU - Lo, W. K.

AU - Spence, John

PY - 1993

Y1 - 1993

N2 - Scanning tunneling microscope (STM) image artifacts have been studied using an STM operating inside a transmission electron microscope (TEM). This instrument allows independent imaging of the same region by STM and reflection electron microscopy (REM). Modifications made recently have increased its rigidity. STM atomic resolution imaging of graphite inside the TEM demonstrate its stability. Comparison of STM and REM images of nanometer-scale features have revealed image artifacts caused by the STM tip. In particular, instances where features were broadened by tip convolution have been directly identified. Broadening of objects by up to three times is a common occurrence. We have also found instances where features were compressed by the STM tip while imaging. This results in inaccurate STM height information about the feature. This leads to questions about the accuracy of STM images of nanometer-scale features.

AB - Scanning tunneling microscope (STM) image artifacts have been studied using an STM operating inside a transmission electron microscope (TEM). This instrument allows independent imaging of the same region by STM and reflection electron microscopy (REM). Modifications made recently have increased its rigidity. STM atomic resolution imaging of graphite inside the TEM demonstrate its stability. Comparison of STM and REM images of nanometer-scale features have revealed image artifacts caused by the STM tip. In particular, instances where features were broadened by tip convolution have been directly identified. Broadening of objects by up to three times is a common occurrence. We have also found instances where features were compressed by the STM tip while imaging. This results in inaccurate STM height information about the feature. This leads to questions about the accuracy of STM images of nanometer-scale features.

UR - http://www.scopus.com/inward/record.url?scp=0027578612&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0027578612&partnerID=8YFLogxK

U2 - 10.1016/0304-3991(93)90119-I

DO - 10.1016/0304-3991(93)90119-I

M3 - Article

AN - SCOPUS:0027578612

VL - 48

SP - 433

EP - 444

JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

IS - 4

ER -