@article{0a9242a219344c1ea86205e8bdc4483b,
title = "Investigation of Single-Event Transients in Voltage-Controlled Oscillators",
abstract = "The responses of voltage-controlled oscillators (VCOs) to single-event transients (SETs) are investigated. Laser testing and simulations indicate that ion strikes on critical transistors cause distortions in the oscillating output. The time it takes for the circuit to resume its normal operating condition is limited by the recovery time of the affected transistor(s) and the oscillator startup time. These limits to circuit recovery time are the primary causes of the frequency dependence of SET responses in VCOs.",
keywords = "Radio frequency, SiGe hetero-junction bipolar transistor, Single-event transients (SETs), Spectrum analyzer, Voltage-controlled oscillators",
author = "Wenjian Chen and Vincent Pouget and Barnaby, {Hugh J.} and Cressler, {John D.} and Guofu Niu and Pascal Fouillat and Yann Deval and Dean Lewis",
note = "Funding Information: Manuscript received July 22, 2003; revised September 17, 2003. This work was supported by the College of Engineering and Mines at the University of Arizona. W. Chen and H. J. Barnaby are with the University of Arizona, Tucson, AZ 85721 USA (e-mail: wenjian@email.arizona.edu). V. Pouget, P. Fouillat, Y. Deval, and D. Lewis are with IXL Laboratory, University Bordeaux 1, Talence, France (e-mail: pouget@ixl.u-bordeaux.fr). J. D. Cressler is with Georgia Institute of Technology, Atlanta, GA 30332 USA (e-mail: cressler@ece.gatech.edu). G. Niu is with Auburn University, Auburn, AL 36849 USA (e-mail: niuguof@eng.auburn.edu). Digital Object Identifier 10.1109/TNS.2003.820766 Funding Information: This work was supported by the College of Engineering and Mines at the University of Arizona. The authors are grateful to B. Vermeire, C. Rougier, and D. Espinosa for their useful discussions and support of this work.",
year = "2003",
month = dec,
doi = "10.1109/TNS.2003.820766",
language = "English (US)",
volume = "50",
pages = "2081--2087",
journal = "IEEE Transactions on Nuclear Science",
issn = "0018-9499",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6 I",
}