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Investigation of single-bit and multiple-bit upsets in oxide RRAM-based 1T1R and crossbar memory arrays
Rui Liu, Debayan Mahalanabis, Hugh Barnaby, Shimeng Yu
- Connection One (C1)
- Embedded Systems, Consortium for (CES)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- Applied Nanoionics, Center for (CANi)
- Solid State Electronics Research Center (CSSER)
- Electrical Engineering
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Computing and Augmented Intelligence, School of (IAFSE-SCAI)
- Computer Science and Engineering
Research output: Contribution to journal › Article › peer-review
33
Scopus
citations