Investigation of Plasmon-Induced Losses in Quasi-Ballistic Transport

P. Lugli, D. K. Ferry

Research output: Contribution to journalArticle

29 Scopus citations

Abstract

We present an ensemble Monte Carlo (EMC) simulation of the effect of electron-electron (e-e) and electron-plasmon (e-pl) interactions on the transient behavior of electrons under high energy injection conditions. It is shown that, in a situation that closely resembles that obtained in the base of a planar-doped barrier (PDB) transistor, the coulombic interaction severely limits the possibility of ballistic transport.

Original languageEnglish (US)
Pages (from-to)25-27
Number of pages3
JournalIEEE Electron Device Letters
Volume6
Issue number1
DOIs
StatePublished - Jan 1 1985

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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