Investigation of coefficient of thermal expansion of silver thin film on different substrates using X-ray diffraction

Engineering & Materials Science

• Silver 100%
• Thermal expansion 93%
• X ray diffraction 90%
• Thin films 86%
• Polyethylenes 64%
• Substrates 64%
• Rutherford backscattering spectroscopy 28%
• Spectrometry 20%
• X ray diffraction analysis 19%
• Evaporation 15%

Physics & Astronomy

• thermal expansion 79%
• silver 75%
• polyethylenes 54%
• coefficients 49%
• diffraction 49%
• thin films 47%
• x rays 41%
• backscattering 13%
• evaporation 11%
• expansion 9%
• spectroscopy 7%

Chemical Compounds

• Thermal Expansion 97%
• X-Ray Diffraction 45%
• Rutherford Backscattering Spectroscopy 19%
• Evaporation 13%